マイクロギャップ電極デバイスを用いたシリカ/エポキシ界面の破壊経路の直接観察

Rina Sankawa; Takuya Onishi; Kohei Takahashi; Motohiro Tomita; Kotaro Mura; Takahiro Nakamura; Tetsuo Yoshimitsu; Takahiro Imai; Takanobu Watanabe

doi:10.1541/ieejfms.140.64

マイクロギャップ電極デバイスを用いたシリカ/エポキシ界面の破壊経路の直接観察

Translated title of the contribution: Direct observation of dielectric breakdown path at silica/epoxy interface with a micro-gap electrode device

Rina Sankawa^*, Takuya Onishi, Kohei Takahashi, Motohiro Tomita, Kotaro Mura, Takahiro Nakamura, Tetsuo Yoshimitsu, Takahiro Imai, Takanobu Watanabe

^*Corresponding author for this work

School of Fundamental Science and Engineering

Research output: Contribution to journal › Article › peer-review

Abstract

We develop a micro-gap electrode device on quartz substrate to investigate the dielectric breakdown resistance on constrained layer of silica/epoxy interface. After application of stress, the device is cut at the middle of the micro-gap by laser dicing to observe the cross-section, and the cross-section shows where the breakdown occurs in the vicinity of the silica/epoxy interface at sub-micron scale. These results give us a clue to understand the effect of nano-fillers on the dielectric breakdown of nano-composite materials.

Translated title of the contribution	Direct observation of dielectric breakdown path at silica/epoxy interface with a micro-gap electrode device
Original language	Japanese
Pages (from-to)	64-69
Number of pages	6
Journal	IEEJ Transactions on Fundamentals and Materials
Volume	140
Issue number	2
DOIs	https://doi.org/10.1541/ieejfms.140.64
Publication status	Published - 2020

ASJC Scopus subject areas

Electrical and Electronic Engineering

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10.1541/ieejfms.140.64

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title = "マイクロギャップ電極デバイスを用いたシリカ/エポキシ界面の破壊経路の直接観察",

abstract = "We develop a micro-gap electrode device on quartz substrate to investigate the dielectric breakdown resistance on constrained layer of silica/epoxy interface. After application of stress, the device is cut at the middle of the micro-gap by laser dicing to observe the cross-section, and the cross-section shows where the breakdown occurs in the vicinity of the silica/epoxy interface at sub-micron scale. These results give us a clue to understand the effect of nano-fillers on the dielectric breakdown of nano-composite materials.",

keywords = "Dielectric breakdown, Electrical treeing, Interface, Nano-composite, SEM, Silica",

author = "Rina Sankawa and Takuya Onishi and Kohei Takahashi and Motohiro Tomita and Kotaro Mura and Takahiro Nakamura and Tetsuo Yoshimitsu and Takahiro Imai and Takanobu Watanabe",

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year = "2020",

doi = "10.1541/ieejfms.140.64",

language = "Japanese",

volume = "140",

pages = "64--69",

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T1 - マイクロギャップ電極デバイスを用いたシリカ/エポキシ界面の破壊経路の直接観察

AU - Sankawa, Rina

AU - Onishi, Takuya

AU - Takahashi, Kohei

AU - Tomita, Motohiro

AU - Mura, Kotaro

AU - Nakamura, Takahiro

AU - Yoshimitsu, Tetsuo

AU - Imai, Takahiro

AU - Watanabe, Takanobu

PY - 2020

Y1 - 2020

N2 - We develop a micro-gap electrode device on quartz substrate to investigate the dielectric breakdown resistance on constrained layer of silica/epoxy interface. After application of stress, the device is cut at the middle of the micro-gap by laser dicing to observe the cross-section, and the cross-section shows where the breakdown occurs in the vicinity of the silica/epoxy interface at sub-micron scale. These results give us a clue to understand the effect of nano-fillers on the dielectric breakdown of nano-composite materials.

AB - We develop a micro-gap electrode device on quartz substrate to investigate the dielectric breakdown resistance on constrained layer of silica/epoxy interface. After application of stress, the device is cut at the middle of the micro-gap by laser dicing to observe the cross-section, and the cross-section shows where the breakdown occurs in the vicinity of the silica/epoxy interface at sub-micron scale. These results give us a clue to understand the effect of nano-fillers on the dielectric breakdown of nano-composite materials.

KW - Dielectric breakdown

KW - Electrical treeing

KW - Interface

KW - Nano-composite

KW - SEM

KW - Silica

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マイクロギャップ電極デバイスを用いたシリカ/エポキシ界面の破壊経路の直接観察

Abstract

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