We develop a micro-gap electrode device on quartz substrate to investigate the dielectric breakdown resistance on constrained layer of silica/epoxy interface. After application of stress, the device is cut at the middle of the micro-gap by laser dicing to observe the cross-section, and the cross-section shows where the breakdown occurs in the vicinity of the silica/epoxy interface at sub-micron scale. These results give us a clue to understand the effect of nano-fillers on the dielectric breakdown of nano-composite materials.
|Translated title of the contribution||Direct observation of dielectric breakdown path at silica/epoxy interface with a micro-gap electrode device|
|Number of pages||6|
|Journal||IEEJ Transactions on Fundamentals and Materials|
|Publication status||Published - 2020|
ASJC Scopus subject areas
- Electrical and Electronic Engineering