A 100-Bit-Output Modeling Attack-Resistant SPN Strong PUF with Uniform and High-Randomness Response

Kunyang Liu*, Yichen Tang, Shufan Xu, Ruilin Zhang, Hirofumi Shinohara

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Strong physically unclonable function (Strong PUF) [1] is a unified solution for lightweight IoT edge device authentication (Fig. 1). Although recent research made breakthroughs on the conventional issue of modeling attack vulnerability, these studies had to limit the output to 1 bit [2] -[4] or 5 bits [5] using XOR in the final stage. To generate enough response bits for one authentication period, e.g., 100 bits, either 100-time server communications (latency/energy/CRP consumption in communications) or multiple parallel Strong PUF macros (huge area) are required. The reason of limitation is that the pre-XOR response bits have high correlation, and each bit is not random enough when the challenge input changes. In this case, an attacker can simplify the attack model and break the Strong PUF. It is a big challenge to expand the output space securely without increasing entropy sources.

Original languageEnglish
Title of host publication2023 IEEE Custom Integrated Circuits Conference, CICC 2023 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798350399486
DOIs
Publication statusPublished - 2023
Event44th Annual IEEE Custom Integrated Circuits Conference, CICC 2023 - San Antonio, United States
Duration: 2023 Apr 232023 Apr 26

Publication series

NameProceedings of the Custom Integrated Circuits Conference
Volume2023-April
ISSN (Print)0886-5930

Conference

Conference44th Annual IEEE Custom Integrated Circuits Conference, CICC 2023
Country/TerritoryUnited States
CitySan Antonio
Period23/4/2323/4/26

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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