TY - GEN
T1 - A 600MHz MTJ-based nonvolatile latch making use of incubation time in MTJ switching
AU - Endoh, T.
AU - Togashi, S.
AU - Iga, F.
AU - Yoshida, Y.
AU - Ohsawa, T.
AU - Koike, H.
AU - Fukami, S.
AU - Ikeda, S.
AU - Kasai, N.
AU - Sakimura, N.
AU - Hanyu, T.
AU - Ohno, H.
PY - 2011/12/1
Y1 - 2011/12/1
N2 - The incubation (transit) time of the perpendicular magnetic tunnel junction (MTJ) is found shorter (longer) than the in-plane MTJ. By making use of the incubation time, a new concept is proposed for MTJ/CMOS hybrid circuits that operate as fast as CMOS circuits without operation power overhead and with negligible MTJ switching error. A nonvolatile latch based on the concept is fabricated in 90nm technology to demonstrate 600MHz stable operation.
AB - The incubation (transit) time of the perpendicular magnetic tunnel junction (MTJ) is found shorter (longer) than the in-plane MTJ. By making use of the incubation time, a new concept is proposed for MTJ/CMOS hybrid circuits that operate as fast as CMOS circuits without operation power overhead and with negligible MTJ switching error. A nonvolatile latch based on the concept is fabricated in 90nm technology to demonstrate 600MHz stable operation.
UR - http://www.scopus.com/inward/record.url?scp=84857027206&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84857027206&partnerID=8YFLogxK
U2 - 10.1109/IEDM.2011.6131487
DO - 10.1109/IEDM.2011.6131487
M3 - Conference contribution
AN - SCOPUS:84857027206
SN - 9781457705052
T3 - Technical Digest - International Electron Devices Meeting, IEDM
SP - 4.3.1-4.3.4
BT - 2011 International Electron Devices Meeting, IEDM 2011
T2 - 2011 IEEE International Electron Devices Meeting, IEDM 2011
Y2 - 5 December 2011 through 7 December 2011
ER -