TY - GEN
T1 - A fast and accurate interest points detection algorithm on 3D meshes using extension of harris operator combined with Hilbert scanning distance
AU - Tibyani, Tibyani
AU - Kamata, Sei Ichiro
PY - 2012/12/1
Y1 - 2012/12/1
N2 - The main purpose of interest points detection (IPD) for 3D objects based on Harris operator is to find the fast computation of weighted average of the derivative data for different points. In this paper, we analyze the extension of Harris operator using Hausdorff distance (EHOHD) and propose the extension of Harris operator using Hilbert scanning distance (EHOHSD) as a new proposed method to IPD on 3D manifold triangular meshes data. Proposed EHOHSD method is 6-16 times faster than EHOHD method. The quality of this IPD with EHOHSD was measured using the repeatability criterion.
AB - The main purpose of interest points detection (IPD) for 3D objects based on Harris operator is to find the fast computation of weighted average of the derivative data for different points. In this paper, we analyze the extension of Harris operator using Hausdorff distance (EHOHD) and propose the extension of Harris operator using Hilbert scanning distance (EHOHSD) as a new proposed method to IPD on 3D manifold triangular meshes data. Proposed EHOHSD method is 6-16 times faster than EHOHD method. The quality of this IPD with EHOHSD was measured using the repeatability criterion.
KW - 3D interest points detection
KW - 3D triangular mesh
KW - Harris operator
KW - Hausdorff distance
KW - Hilbert scanning distance
UR - http://www.scopus.com/inward/record.url?scp=84876757296&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84876757296&partnerID=8YFLogxK
U2 - 10.1109/ISIEA.2012.6496662
DO - 10.1109/ISIEA.2012.6496662
M3 - Conference contribution
AN - SCOPUS:84876757296
SN - 9781467330046
T3 - ISIEA 2012 - 2012 IEEE Symposium on Industrial Electronics and Applications
SP - 367
EP - 371
BT - ISIEA 2012 - 2012 IEEE Symposium on Industrial Electronics and Applications
T2 - 2012 IEEE Symposium on Industrial Electronics and Applications, ISIEA 2012
Y2 - 23 September 2012 through 26 September 2012
ER -