A Fast and Accurate Point Pattern Matching Algorithm Based on Multi-Hilbert Scans

Jegoon Ryu*, Sei ichiro Kamata

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution


This paper proposes a novel distance measurement using multi-Hilbert scans for matching point patterns on images. A modified Hausdorff distance has been widely used for point pattern matching, recognition tasks, and evaluation of medical image segmentation. However, the computation cost increases sharply with the number of feature points or the increase of data sets. Multi-Hilbert Scanning Distance (MHSD) based on sets of one-dimensional points using Hilbert scans is introduced to overcome this problem. MHSD consists of a combination of four directional Hilbert scans and diagonally shifted Hilbert scans. The proposed method was tested on vehicle images and compared with Hausdorff distance, partial Hausdorff distance, and modified Hausdorff distance. Experimental results show that the proposed method outperforms the compared methods.

Original languageEnglish
Title of host publicationPattern Recognition - 6th Asian Conference, ACPR 2021, Revised Selected Papers
EditorsChristian Wallraven, Qingshan Liu, Hajime Nagahara
PublisherSpringer Science and Business Media Deutschland GmbH
Number of pages13
ISBN (Print)9783031024436
Publication statusPublished - 2022
Event6th Asian Conference on Pattern Recognition, ACPR 2021 - Virtual, Online
Duration: 2021 Nov 92021 Nov 12

Publication series

NameLecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
Volume13189 LNCS
ISSN (Print)0302-9743
ISSN (Electronic)1611-3349


Conference6th Asian Conference on Pattern Recognition, ACPR 2021
CityVirtual, Online


  • Hausdorff distance (HD)
  • Hilbert scan
  • Modified Hausdorff distance (MHD)
  • Multi-Hilbert Scanning Distance (MHSD)
  • Point Pattern Matching (PPM)

ASJC Scopus subject areas

  • Theoretical Computer Science
  • Computer Science(all)


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