A high precision positive temperature circuit using DEM technique

Hang Liu, Yu Jin, Xin Hang Li, Duli Yu, Kedu Han, Heming Sun

Research output: Contribution to journalConference articlepeer-review


A novel positive temperature voltage circuit structure with dynamic element matching(DEM) calibration technology is proposed in this paper. The consistency of the thermometer output voltage is an important factor to ameliorate the precision in a thermometer circuit. The introduction of DEM technology reduces the mismatch error of the current source in the positive temperature voltage generating circuit, and improves the output voltage accuracy and voltage consistency. The circuit simulation results show that the positive temperature generating circuit using the DEM calibration circuit can reduce the offset voltage by 83.4% with good linearity property within -55°C to 125°C. The proposed positive temperature voltage circuit with DEM calibration is also considered to reduce power consumption and circuit complexity.

Original languageEnglish
JournalProceedings of International Conference on ASIC
Publication statusPublished - 2021
Event14th IEEE International Conference on ASIC, ASICON 2021 - Kunming, China
Duration: 2021 Oct 262021 Oct 29

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering


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