A hybrid dictionary test data compression for multiscan-based designs

Youhua Shi*, Shinji Kimura, Masao Yanagisawa, Tatsuo Ohtsuki

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review


In this paper, we present a test data compression technique to reduce test data volume for multiscan-based designs. In our method the internal scan chains are divided into equal sized groups and two dictionaries were build to encode either an entire slice or a subset of the slice. Depending on the codeword, the decompressor may load all scan chains or may load only a group of the scan chains, which can enhance the effectiveness of dictionary-based compression. In contrast to previous dictionary coding techniques, even for the CUT with a large number of scan chains, the proposed approach can achieve satisfied reduction in test data volume with a reasonable smaller dictionary. Experimental results showed the proposed test scheme works particularly well for the large ISCAS'89 benchmarks.

Original languageEnglish
Pages (from-to)3193-3199
Number of pages7
JournalIEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
Issue number12
Publication statusPublished - 2004 Dec


  • ATE
  • Multiple scan chain
  • Test data compression
  • Test slice

ASJC Scopus subject areas

  • Signal Processing
  • Computer Graphics and Computer-Aided Design
  • Electrical and Electronic Engineering
  • Applied Mathematics


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