Abstract
In this paper, we present a test data compression technique to reduce test data volume for multiscan-based designs. In our method the internal scan chains are divided into equal sized groups and two dictionaries were build to encode either an entire slice or a subset of the slice. Depending on the codeword, the decompressor may load all scan chains or may load only a group of the scan chains, which can enhance the effectiveness of dictionary-based compression. In contrast to previous dictionary coding techniques, even for the CUT with a large number of scan chains, the proposed approach can achieve satisfied reduction in test data volume with a reasonable smaller dictionary. Experimental results showed the proposed test scheme works particularly well for the large ISCAS'89 benchmarks.
Original language | English |
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Pages (from-to) | 3193-3199 |
Number of pages | 7 |
Journal | IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences |
Volume | E87-A |
Issue number | 12 |
Publication status | Published - 2004 Dec |
Keywords
- ATE
- Multiple scan chain
- Test data compression
- Test slice
ASJC Scopus subject areas
- Signal Processing
- Computer Graphics and Computer-Aided Design
- Electrical and Electronic Engineering
- Applied Mathematics