A hypothesis verification method using a regression tree for semiconductor yield analysis

Hidetaka Tsuda*, Hidehiro Shirai, Masahiro Terabe, Kazuo Hashimoto, Ayumi Shinohara

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Fingerprint

Dive into the research topics of 'A hypothesis verification method using a regression tree for semiconductor yield analysis'. Together they form a unique fingerprint.

Engineering & Materials Science