Abstract
The future development of low-temperature and low-pressure bonding technology is necessary for fine-pitch bump application. We propose a bump structure using Ag nanoparticles as an intermediate layer coated on a fine-pitch Cu pillar bump. The intermediate layer is prepared using an efficient and cost-saving squeegee-coating method followed by a 100°C baking process. This bump structure can be easily flattened before the bonding process, and the low-temperature sinterability of the nanoparticles is retained. The bonding experiment was successfully performed at 250°C and 39.8 MPa and the bonding strength was comparable to that achieved via other bonding technology utilizing metal particles or porous material as bump materials.
Original language | English |
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Pages (from-to) | 4646-4652 |
Number of pages | 7 |
Journal | Journal of Electronic Materials |
Volume | 44 |
Issue number | 11 |
DOIs | |
Publication status | Published - 2015 Nov 1 |
Keywords
- Ag nanoparticle
- Flip-chip bonding
- fine-pitch bump
- low-pressure bonding
- low-temperature bonding
- metal bump bonding
- sintering bonding
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Electrical and Electronic Engineering
- Materials Chemistry