A metric for measuring the abstraction level of design patterns

Atsuto Kubo; Hironori Washizaki; Yoshiaki Fukazawa

doi:10.1145/1772070.1772093

A metric for measuring the abstraction level of design patterns

Atsuto Kubo^*, Hironori Washizaki, Yoshiaki Fukazawa

^*Corresponding author for this work

School of Fundamental Science and Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

The abstraction level of the problem treated by a design pattern has wide variety, from architecture to near implementation. There is no objective metric indicating the abstraction level of the problems addressed by patterns. Thus, it is difficult to understand the abstraction level of each pattern and to position a new pattern. In this paper, a metric is proposed. It indicates the relative abstraction level of a pattern's problem. We propose a metric obtained from inter-pattern relationships. We also propose a visualization method for the metric. Using such metrics, we aim to help developers easily understand the abstraction level of each pattern and, therefore, to better decide about its usefulness for the problem at hand.

Original language	English
Title of host publication	PLoP07 - 14th Conference on Pattern Languages of Programs, Proceedings
DOIs	https://doi.org/10.1145/1772070.1772093
Publication status	Published - 2007 Dec 1
Event	14th Conference on Pattern Languages of Programs, PLoP '07 - Monticello, IL, United States Duration: 2007 Sept 5 → 2007 Sept 8

Publication series

Name	ACM International Conference Proceeding Series

Conference

Conference	14th Conference on Pattern Languages of Programs, PLoP '07
Country/Territory	United States
City	Monticello, IL
Period	07/9/5 → 07/9/8

Keywords

interpattern relationships
patterns

ASJC Scopus subject areas

Software
Human-Computer Interaction
Computer Vision and Pattern Recognition
Computer Networks and Communications

Access to Document

10.1145/1772070.1772093

Cite this

Kubo, A, Washizaki, H & Fukazawa, Y 2007, A metric for measuring the abstraction level of design patterns. in PLoP07 - 14th Conference on Pattern Languages of Programs, Proceedings., 1772093, ACM International Conference Proceeding Series, 14th Conference on Pattern Languages of Programs, PLoP '07, Monticello, IL, United States, 07/9/5. https://doi.org/10.1145/1772070.1772093

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abstract = "The abstraction level of the problem treated by a design pattern has wide variety, from architecture to near implementation. There is no objective metric indicating the abstraction level of the problems addressed by patterns. Thus, it is difficult to understand the abstraction level of each pattern and to position a new pattern. In this paper, a metric is proposed. It indicates the relative abstraction level of a pattern's problem. We propose a metric obtained from inter-pattern relationships. We also propose a visualization method for the metric. Using such metrics, we aim to help developers easily understand the abstraction level of each pattern and, therefore, to better decide about its usefulness for the problem at hand.",

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N2 - The abstraction level of the problem treated by a design pattern has wide variety, from architecture to near implementation. There is no objective metric indicating the abstraction level of the problems addressed by patterns. Thus, it is difficult to understand the abstraction level of each pattern and to position a new pattern. In this paper, a metric is proposed. It indicates the relative abstraction level of a pattern's problem. We propose a metric obtained from inter-pattern relationships. We also propose a visualization method for the metric. Using such metrics, we aim to help developers easily understand the abstraction level of each pattern and, therefore, to better decide about its usefulness for the problem at hand.

AB - The abstraction level of the problem treated by a design pattern has wide variety, from architecture to near implementation. There is no objective metric indicating the abstraction level of the problems addressed by patterns. Thus, it is difficult to understand the abstraction level of each pattern and to position a new pattern. In this paper, a metric is proposed. It indicates the relative abstraction level of a pattern's problem. We propose a metric obtained from inter-pattern relationships. We also propose a visualization method for the metric. Using such metrics, we aim to help developers easily understand the abstraction level of each pattern and, therefore, to better decide about its usefulness for the problem at hand.

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A metric for measuring the abstraction level of design patterns

Abstract

Publication series

Conference

Keywords

ASJC Scopus subject areas

Access to Document

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