A new low power BIST methodology by altering the structure of linear feedback shift registers

Rui Li; Chen Hu; Jun Yang; Zhe Zhang; Youhua Shi; Longxing Shi

A new low power BIST methodology by altering the structure of linear feedback shift registers

Rui Li^*, Chen Hu, Jun Yang, Zhe Zhang, Youhua Shi, Longxing Shi

^*Corresponding author for this work

Research output: Contribution to conference › Paper › peer-review

7 Citations (Scopus)

Abstract

In this paper a new low power BIST methodology by altering the structure of linear feedback shift register (LFSR) is proposed. In pseudo-random test mode, the efficiency of the vectors decreases sharply as the test progresses. For low power consumption during test mode, the proposed approach ignores the non-detecting vectors by altering the structure of LFSR. Note that altering the structure of LFSR is efficient, and its has no impact on the fault coverage.

Original language	English
Pages	646-649
Number of pages	4
Publication status	Published - 2001
Externally published	Yes
Event	4th International Conference on ASIC Proceedings - Shanghai, China Duration: 2001 Oct 23 → 2001 Oct 25

Conference

Conference	4th International Conference on ASIC Proceedings
Country/Territory	China
City	Shanghai
Period	01/10/23 → 01/10/25

ASJC Scopus subject areas

Engineering(all)

Cite this

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abstract = "In this paper a new low power BIST methodology by altering the structure of linear feedback shift register (LFSR) is proposed. In pseudo-random test mode, the efficiency of the vectors decreases sharply as the test progresses. For low power consumption during test mode, the proposed approach ignores the non-detecting vectors by altering the structure of LFSR. Note that altering the structure of LFSR is efficient, and its has no impact on the fault coverage.",

author = "Rui Li and Chen Hu and Jun Yang and Zhe Zhang and Youhua Shi and Longxing Shi",

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T1 - A new low power BIST methodology by altering the structure of linear feedback shift registers

AU - Li, Rui

AU - Hu, Chen

AU - Yang, Jun

AU - Zhang, Zhe

AU - Shi, Youhua

AU - Shi, Longxing

PY - 2001

Y1 - 2001

N2 - In this paper a new low power BIST methodology by altering the structure of linear feedback shift register (LFSR) is proposed. In pseudo-random test mode, the efficiency of the vectors decreases sharply as the test progresses. For low power consumption during test mode, the proposed approach ignores the non-detecting vectors by altering the structure of LFSR. Note that altering the structure of LFSR is efficient, and its has no impact on the fault coverage.

AB - In this paper a new low power BIST methodology by altering the structure of linear feedback shift register (LFSR) is proposed. In pseudo-random test mode, the efficiency of the vectors decreases sharply as the test progresses. For low power consumption during test mode, the proposed approach ignores the non-detecting vectors by altering the structure of LFSR. Note that altering the structure of LFSR is efficient, and its has no impact on the fault coverage.

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UR - http://www.scopus.com/inward/citedby.url?scp=0035721073&partnerID=8YFLogxK

M3 - Paper

AN - SCOPUS:0035721073

SP - 646

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T2 - 4th International Conference on ASIC Proceedings

Y2 - 23 October 2001 through 25 October 2001

ER -

A new low power BIST methodology by altering the structure of linear feedback shift registers

Abstract

Conference

ASJC Scopus subject areas

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