Abstract
We have investigated polarized Raman spectra of epitaxial Pb(Zr x Ti 1-x )O 3 (PZT) thin films (x = 0.35) in which the volume ratio of the polar c -domains is systematically varied from 4 to 96% relative to the non-polar a -domains, and a new method using polarized Raman spectroscopy to characterize a relative volume of c -domain in a PZT film is proposed. This method depends on discovery that an intensity of A 1 (1TO) is proportional to the relative volume of c -domain. Polarized Raman spectroscopy is necessary to separate the peaks from A 1 (1TO) and B 1 modes to any other modes.
Original language | English |
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Title of host publication | Integrated Ferroelectrics |
Pages | 281-287 |
Number of pages | 7 |
Volume | 78 |
Edition | 1 |
DOIs | |
Publication status | Published - 2006 Nov 1 |
Externally published | Yes |
Keywords
- Domain distribution
- PbZrTiO(PZT)
- Raman scattering
- Thin film
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Physics and Astronomy (miscellaneous)
- Condensed Matter Physics
- Electronic, Optical and Magnetic Materials