TY - GEN
T1 - A pattern for reconstructing test code based on test coverage
AU - Sakamoto, Kazunori
AU - Washizaki, Hironori
AU - Wada, Takuto
AU - Fukazawa, Yoshiaki
PY - 2010
Y1 - 2010
N2 - The duplicated test code exists widely in source code. However duplicated test code decreases maintainability. We therefore extract and propose a pattern for reconstructing test code to remove the duplication. The pattern finds duplicated test code based on test coverage and helps to remove redundant test code. We contribute to advancement and the spread of the test technology by describing the patter.
AB - The duplicated test code exists widely in source code. However duplicated test code decreases maintainability. We therefore extract and propose a pattern for reconstructing test code to remove the duplication. The pattern finds duplicated test code based on test coverage and helps to remove redundant test code. We contribute to advancement and the spread of the test technology by describing the patter.
UR - http://www.scopus.com/inward/record.url?scp=84867719429&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84867719429&partnerID=8YFLogxK
U2 - 10.1145/2371736.2371758
DO - 10.1145/2371736.2371758
M3 - Conference contribution
AN - SCOPUS:84867719429
SN - 9781450301268
T3 - ACM International Conference Proceeding Series
BT - AsianPLoP 2010 - 1st Asian Conference on Pattern Languages of Programs, Proceedings
T2 - 1st Asian Conference on Pattern Languages of Programs, AsianPLoP 2010
Y2 - 16 March 2010 through 17 March 2010
ER -