TY - GEN
T1 - A power-saved 1Gbps irregular LDPC decoder based on simplified min-sum algorithm
AU - Wang, Qi
AU - Shimizu, Kazunori
AU - Ikenaga, Takeshi
AU - Goto, Satoshi
PY - 2007/9/28
Y1 - 2007/9/28
N2 - In this paper we proposed a fully-parallel irregular LDPC decoder which uses only registers to store the temporary intrinsic messages. Our decoder adopts a simplified min-sum algorithm to reduce the hardware implementation complexity and area, and due to the factor modification we achieve a negligible performance loss compared with the general min-sum algorithm. Considering reducing the power consumption, we also propose a power-saved strategy according to which the message evolution will halt as the parity-check condition is satisfied. This strategy will save us higher than 50% power under good channel condition. The synthesis result in 0.18μm CMOS technology shows our decoder for (648,540) irregular LDPC code achieves high throughput (1 Gbps) with 9.0ns latency.
AB - In this paper we proposed a fully-parallel irregular LDPC decoder which uses only registers to store the temporary intrinsic messages. Our decoder adopts a simplified min-sum algorithm to reduce the hardware implementation complexity and area, and due to the factor modification we achieve a negligible performance loss compared with the general min-sum algorithm. Considering reducing the power consumption, we also propose a power-saved strategy according to which the message evolution will halt as the parity-check condition is satisfied. This strategy will save us higher than 50% power under good channel condition. The synthesis result in 0.18μm CMOS technology shows our decoder for (648,540) irregular LDPC code achieves high throughput (1 Gbps) with 9.0ns latency.
UR - http://www.scopus.com/inward/record.url?scp=34648816388&partnerID=8YFLogxK
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U2 - 10.1109/VDAT.2007.373219
DO - 10.1109/VDAT.2007.373219
M3 - Conference contribution
AN - SCOPUS:34648816388
SN - 1424405831
SN - 9781424405831
T3 - 2007 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2007 - Proceedings of Technical Papers
BT - 2007 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2007 - Proceedings of Technical Papers
T2 - 2007 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2007
Y2 - 25 April 2007 through 27 April 2007
ER -