A secure test technique for pipelined advanced encryption standard

Youhua Shi*, Nozomu Togawa, Masao Yanagisawa, Tatsuo Ohtsuki

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)


In this paper, we presented a Design-for-Secure-Test (DFST) technique for pipelined AES to guarantee both the security and the test quality during testing. Unlike previous works, the proposed method can keep all the secrets inside and provide high test quality and fault diagnosis ability as well. Furthermore, the proposed DFST technique can significantly reduce test application time, test data volume, and test generation effort as additional benefits.

Original languageEnglish
Pages (from-to)776-780
Number of pages5
JournalIEICE Transactions on Information and Systems
Issue number3
Publication statusPublished - 2008 Mar


  • Scan test
  • Security
  • Test quality

ASJC Scopus subject areas

  • Software
  • Hardware and Architecture
  • Computer Vision and Pattern Recognition
  • Electrical and Electronic Engineering
  • Artificial Intelligence


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