TY - GEN
T1 - A Study of Distance Metric Learning by Considering the Distances between Category Centroids
AU - Mikawa, Kenta
AU - Kobayashi, Manabu
AU - Goto, Masayuki
AU - Hirasawa, Shigeichi
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2016/1/12
Y1 - 2016/1/12
N2 - In this paper, we focus on pattern recognition based on the vector space model. As one of the methods, distance metric learning is known for the learning metric matrix under the arbitrary constraint. Generally, it uses iterative optimization procedure in order to gain suitable distance structure by considering the statistical characteristics of training data. Most of the distance metric learning methods estimate suitable metric matrix from all pairs of training data. However, the computational cost is considerable if the number of training data increases in this setting. To avoid this problem, we propose the way of learning distance metric by using the each category centroid. To verify the effectiveness of proposed method, we conduct the simulation experiment by using benchmark data.
AB - In this paper, we focus on pattern recognition based on the vector space model. As one of the methods, distance metric learning is known for the learning metric matrix under the arbitrary constraint. Generally, it uses iterative optimization procedure in order to gain suitable distance structure by considering the statistical characteristics of training data. Most of the distance metric learning methods estimate suitable metric matrix from all pairs of training data. However, the computational cost is considerable if the number of training data increases in this setting. To avoid this problem, we propose the way of learning distance metric by using the each category centroid. To verify the effectiveness of proposed method, we conduct the simulation experiment by using benchmark data.
KW - Distance Metric Learning
KW - Pattern Recognition
KW - Regularization
KW - Vector Space Model
UR - http://www.scopus.com/inward/record.url?scp=84964514099&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84964514099&partnerID=8YFLogxK
U2 - 10.1109/SMC.2015.290
DO - 10.1109/SMC.2015.290
M3 - Conference contribution
AN - SCOPUS:84964514099
T3 - Proceedings - 2015 IEEE International Conference on Systems, Man, and Cybernetics, SMC 2015
SP - 1645
EP - 1650
BT - Proceedings - 2015 IEEE International Conference on Systems, Man, and Cybernetics, SMC 2015
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - IEEE International Conference on Systems, Man, and Cybernetics, SMC 2015
Y2 - 9 October 2015 through 12 October 2015
ER -