Abstract
An improved version of the laser speckle strain gauge is presented in which speckle displacement caused by deformation of a laser-illuminated object is detected in real time using new photodetectors in place of the linear image sensors and microcomputer in the conventional version. The detector, called a spatial filtering detector with electronic scanning produces a voltage directly proportional to speckle displacement. Therefore, this strain gage, which utilizes differential speckle displacement, delivers a voltage that is proportional to surface strain. It has a strain sensitivity of a few millivolts per microstrain. We applied this gauge to strain measurements of high-polymer films in various directions under loading at frequencies up to several tens of hertz and were able to evaluate their Poisson ratios.
| Original language | English |
|---|---|
| Pages (from-to) | 671-676 |
| Number of pages | 6 |
| Journal | Optical Engineering |
| Volume | 25 |
| Issue number | 5 |
| Publication status | Published - 1986 May |
| Externally published | Yes |
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics