Ichirou Yamaguchi*, Takeo Furukawa, Toshitsugu Ueda, Eiji Ogita

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

17 Citations (Scopus)


An improved version of the laser speckle strain gauge is presented in which speckle displacement caused by deformation of a laser-illuminated object is detected in real time using new photodetectors in place of the linear image sensors and microcomputer in the conventional version. The detector, called a spatial filtering detector with electronic scanning produces a voltage directly proportional to speckle displacement. Therefore, this strain gage, which utilizes differential speckle displacement, delivers a voltage that is proportional to surface strain. It has a strain sensitivity of a few millivolts per microstrain. We applied this gauge to strain measurements of high-polymer films in various directions under loading at frequencies up to several tens of hertz and were able to evaluate their Poisson ratios.

Original languageEnglish
Pages (from-to)671-676
Number of pages6
JournalOptical Engineering
Issue number5
Publication statusPublished - 1986 May
Externally publishedYes

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics


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