Abstract
An improved version of the laser speckle strain gauge is presented in which speckle displacement caused by deformation of a laser illuminated object is detected in real time using new photodetectors in place of linear image sensors and microcomputer in the conventional version. The detector, called a spatial filtering detector with electronic scanning facility, produces a voltage directly proportional to speckle displacement. Therefore, this strain gauge, which utilizes differential speckle displacement, delivers a voltage that is proportional to surface strain. It has a strain sensitivity of a few mV/microstrain. We applied this gauge to strain measurements of high-polymer films in various directions under loading at frequencies up to several tens of Hz and were able to evaluate their Poisson's ratios.
| Original language | English |
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| Title of host publication | Proceedings of SPIE - The International Society for Optical Engineering |
| Editors | Henri H. Arsenault |
| Place of Publication | Bellingham, WA, USA |
| Publisher | SPIE |
| Pages | 132-138 |
| Number of pages | 7 |
| Volume | 556 |
| ISBN (Print) | 0892525916 |
| Publication status | Published - 1985 |
| Externally published | Yes |
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Condensed Matter Physics