TY - JOUR
T1 - Accelerating covering array generation by combinatorial join for industry scale software testing
AU - Ukai, Hiroshi
AU - Qu, Xiao
AU - Washizaki, Hironori
AU - Fukazawa, Yoshiaki
N1 - Funding Information:
Funding The authors received no funding for this work.
Publisher Copyright:
Copyright 2022 Ukai et al.
PY - 2022
Y1 - 2022
N2 - Combinatorial interaction testing, which is a technique to verify a system with numerous input parameters, employs a mathematical object called a covering array as a test input. This technique generates a limited number of test cases while guaranteeing a given combinatorial coverage. Although this area has been studied extensively, handling constraints among input parameters remains a major challenge, which may significantly increase the cost to generate covering arrays. In this work, we propose a mathematical operation, called “weaken-product based combinatorial join”, which constructs a new covering array from two existing covering arrays. The operation reuses existing covering arrays to save computational resource by increasing parallelism during generation without losing combinatorial coverage of the original arrays. Our proposed method significantly reduce the covering array generation time by 13–96% depending on use case scenarios.
AB - Combinatorial interaction testing, which is a technique to verify a system with numerous input parameters, employs a mathematical object called a covering array as a test input. This technique generates a limited number of test cases while guaranteeing a given combinatorial coverage. Although this area has been studied extensively, handling constraints among input parameters remains a major challenge, which may significantly increase the cost to generate covering arrays. In this work, we propose a mathematical operation, called “weaken-product based combinatorial join”, which constructs a new covering array from two existing covering arrays. The operation reuses existing covering arrays to save computational resource by increasing parallelism during generation without losing combinatorial coverage of the original arrays. Our proposed method significantly reduce the covering array generation time by 13–96% depending on use case scenarios.
KW - Automated combinatorial test generation
KW - Automated testing
KW - Combinatorial explosion
KW - Combinatorial interaction testing
KW - Combinatorial testing
KW - Constrained covering array
KW - Covering array
KW - Software
KW - Software testing
KW - Variable strength covering array
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U2 - 10.7717/peerj-cs.720
DO - 10.7717/peerj-cs.720
M3 - Article
AN - SCOPUS:85125422043
SN - 2376-5992
VL - 8
JO - PeerJ Computer Science
JF - PeerJ Computer Science
M1 - e720
ER -