TY - GEN
T1 - Accurate depth-map refinement by per-pixel plane fitting for stereo vision
AU - Yokozuka, Masashi
AU - Tomita, Kohji
AU - Matsumoto, Osamu
AU - Banno, Atsuhiko
N1 - Publisher Copyright:
© 2016 IEEE.
PY - 2016/1/1
Y1 - 2016/1/1
N2 - This paper discusses the refinement of sparse and noisy depth-maps to improve stereo measurements. Our method functions as a post-filter for stereo measurements, to remove outliers and interpolate the depths of invalid pixels. Per-pixel plane fitting is employed to estimate the normals of an object's surface in a depth-map. These normals provide information regarding the interpolation of depth and the removal of outliers by evaluating the directions of surfaces. In our experiments, our method successfully reconstructed a dense and accurate geometry from a sparse and noisy depth-map, even where several dozen percent of pixels were outliers and only a few percent were from the original correct geometry. This result indicates a novel method of fast stereo measurement, because dense reconstruction can be performed without stereo matching for all pixels.
AB - This paper discusses the refinement of sparse and noisy depth-maps to improve stereo measurements. Our method functions as a post-filter for stereo measurements, to remove outliers and interpolate the depths of invalid pixels. Per-pixel plane fitting is employed to estimate the normals of an object's surface in a depth-map. These normals provide information regarding the interpolation of depth and the removal of outliers by evaluating the directions of surfaces. In our experiments, our method successfully reconstructed a dense and accurate geometry from a sparse and noisy depth-map, even where several dozen percent of pixels were outliers and only a few percent were from the original correct geometry. This result indicates a novel method of fast stereo measurement, because dense reconstruction can be performed without stereo matching for all pixels.
UR - http://www.scopus.com/inward/record.url?scp=85019161687&partnerID=8YFLogxK
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U2 - 10.1109/ICPR.2016.7900061
DO - 10.1109/ICPR.2016.7900061
M3 - Conference contribution
AN - SCOPUS:85019161687
T3 - Proceedings - International Conference on Pattern Recognition
SP - 2807
EP - 2812
BT - 2016 23rd International Conference on Pattern Recognition, ICPR 2016
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 23rd International Conference on Pattern Recognition, ICPR 2016
Y2 - 4 December 2016 through 8 December 2016
ER -