Abstract
The aging mechanism of silicone rubber, which is important for electrical insulation of cables, is examined from many aspects such as instrumental, chemical, electrical, and mechanical analyses. As a result, it has become clear that silicone rubber degrades by forming crosslinked structures via the formation of abundant siloxane bonds.
| Original language | English |
|---|---|
| Title of host publication | 2016 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2016 |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Pages | 869-872 |
| Number of pages | 4 |
| Volume | 2016-December |
| ISBN (Electronic) | 9781509046546 |
| DOIs | |
| Publication status | Published - 2016 Dec 15 |
| Event | 2016 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2016 - Toronto, Canada Duration: 2016 Oct 16 → 2016 Oct 19 |
Other
| Other | 2016 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2016 |
|---|---|
| Country/Territory | Canada |
| City | Toronto |
| Period | 16/10/16 → 16/10/19 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering