An artificial fingerprint device (AFD): A study of identification number applications utilizing characteristics variation of polycrystalline silicon TFTs

Shigenobu Maeda; Hirotada Kuriyama; Takashi Ipposhi; Shigeto Maegawa; Yasuo Inoue; Masahide Inuishi; Norihiko Kotani; Tadashi Nishimura

doi:10.1109/TED.2002.808526

An artificial fingerprint device (AFD): A study of identification number applications utilizing characteristics variation of polycrystalline silicon TFTs

Shigenobu Maeda^*, Hirotada Kuriyama, Takashi Ipposhi, Shigeto Maegawa, Yasuo Inoue, Masahide Inuishi, Norihiko Kotani, Tadashi Nishimura

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

22 Citations (Scopus)

Abstract

An idea for obtaining unique identification (ID) numbers using polycrystalline silicon (poly-Si) thin-film transistors (TFTs) with a logic LSI compatible process is proposed. Like an actual human fingerprint, the characteristic variations of poly-Si TFTs are utilized for ID numbers in LSIs. The variation of poly-Si TFT characteristics is random, and this method offers unique, nonalterable, and nonduplicable numbers without any special processes, unlike other methods such as flash memory and mask ROM. These characteristics are highly suitable for ID number applications. The device physics of poly-Si TFTs for realizing the stable recognition of ID numbers was studied and a recognition circuit is proposed. The design guidelines for the grain size of poly-Si and AFD applications are also discussed.

Original language	English
Pages (from-to)	1451-1458
Number of pages	8
Journal	IEEE Transactions on Electron Devices
Volume	50
Issue number	6
DOIs	https://doi.org/10.1109/TED.2002.808526
Publication status	Published - 2003 Jun
Externally published	Yes

Keywords

Crystals
Identification
Random number generation
Silicon
Silicon on insulator technology
Thin-film transistors

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering

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10.1109/TED.2002.808526

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title = "An artificial fingerprint device (AFD): A study of identification number applications utilizing characteristics variation of polycrystalline silicon TFTs",

abstract = "An idea for obtaining unique identification (ID) numbers using polycrystalline silicon (poly-Si) thin-film transistors (TFTs) with a logic LSI compatible process is proposed. Like an actual human fingerprint, the characteristic variations of poly-Si TFTs are utilized for ID numbers in LSIs. The variation of poly-Si TFT characteristics is random, and this method offers unique, nonalterable, and nonduplicable numbers without any special processes, unlike other methods such as flash memory and mask ROM. These characteristics are highly suitable for ID number applications. The device physics of poly-Si TFTs for realizing the stable recognition of ID numbers was studied and a recognition circuit is proposed. The design guidelines for the grain size of poly-Si and AFD applications are also discussed.",

keywords = "Crystals, Identification, Random number generation, Silicon, Silicon on insulator technology, Thin-film transistors",

author = "Shigenobu Maeda and Hirotada Kuriyama and Takashi Ipposhi and Shigeto Maegawa and Yasuo Inoue and Masahide Inuishi and Norihiko Kotani and Tadashi Nishimura",

year = "2003",

month = jun,

doi = "10.1109/TED.2002.808526",

language = "English",

volume = "50",

pages = "1451--1458",

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T2 - A study of identification number applications utilizing characteristics variation of polycrystalline silicon TFTs

AU - Maeda, Shigenobu

AU - Kuriyama, Hirotada

AU - Ipposhi, Takashi

AU - Maegawa, Shigeto

AU - Inoue, Yasuo

AU - Inuishi, Masahide

AU - Kotani, Norihiko

AU - Nishimura, Tadashi

PY - 2003/6

Y1 - 2003/6

N2 - An idea for obtaining unique identification (ID) numbers using polycrystalline silicon (poly-Si) thin-film transistors (TFTs) with a logic LSI compatible process is proposed. Like an actual human fingerprint, the characteristic variations of poly-Si TFTs are utilized for ID numbers in LSIs. The variation of poly-Si TFT characteristics is random, and this method offers unique, nonalterable, and nonduplicable numbers without any special processes, unlike other methods such as flash memory and mask ROM. These characteristics are highly suitable for ID number applications. The device physics of poly-Si TFTs for realizing the stable recognition of ID numbers was studied and a recognition circuit is proposed. The design guidelines for the grain size of poly-Si and AFD applications are also discussed.

AB - An idea for obtaining unique identification (ID) numbers using polycrystalline silicon (poly-Si) thin-film transistors (TFTs) with a logic LSI compatible process is proposed. Like an actual human fingerprint, the characteristic variations of poly-Si TFTs are utilized for ID numbers in LSIs. The variation of poly-Si TFT characteristics is random, and this method offers unique, nonalterable, and nonduplicable numbers without any special processes, unlike other methods such as flash memory and mask ROM. These characteristics are highly suitable for ID number applications. The device physics of poly-Si TFTs for realizing the stable recognition of ID numbers was studied and a recognition circuit is proposed. The design guidelines for the grain size of poly-Si and AFD applications are also discussed.

KW - Crystals

KW - Identification

KW - Random number generation

KW - Silicon

KW - Silicon on insulator technology

KW - Thin-film transistors

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An artificial fingerprint device (AFD): A study of identification number applications utilizing characteristics variation of polycrystalline silicon TFTs

Abstract

Keywords

ASJC Scopus subject areas

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