TY - GEN
T1 - An ASM fitting method based on machine learning that provides a robust parameter initialization for AAM fitting
AU - Wimmer, Matthias
AU - Fujie, Shinya
AU - Stulp, Freek
AU - Kobayashi, Tetsunori
AU - Radig, Bernd
PY - 2008
Y1 - 2008
N2 - Due to their use of information contained in texture, Active Appearance Models (AAM) generally outperform Active Shape Models (ASM) in terms of fitting accuracy. Although many extensions and improvements over the original AAM have been proposed, on of the main drawbacks of AAMs remains its dependence on good initial model parameters to achieve accurate fitting results. In this paper, we determine the initial model parameters for AAM fitting with ASM fitting, and use machine learning techniques to improve the scope and accuracy of ASM fitting. Combining the precision of AAM fitting with the large radius of convergence of learned ASM fitting improves the results by an order of magnitude, as our empirical evaluation n a database of publicly available benchmark images demonstrates.
AB - Due to their use of information contained in texture, Active Appearance Models (AAM) generally outperform Active Shape Models (ASM) in terms of fitting accuracy. Although many extensions and improvements over the original AAM have been proposed, on of the main drawbacks of AAMs remains its dependence on good initial model parameters to achieve accurate fitting results. In this paper, we determine the initial model parameters for AAM fitting with ASM fitting, and use machine learning techniques to improve the scope and accuracy of ASM fitting. Combining the precision of AAM fitting with the large radius of convergence of learned ASM fitting improves the results by an order of magnitude, as our empirical evaluation n a database of publicly available benchmark images demonstrates.
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U2 - 10.1109/AFGR.2008.4813465
DO - 10.1109/AFGR.2008.4813465
M3 - Conference contribution
AN - SCOPUS:67650699768
SN - 9781424421541
T3 - 2008 8th IEEE International Conference on Automatic Face and Gesture Recognition, FG 2008
BT - 2008 8th IEEE International Conference on Automatic Face and Gesture Recognition, FG 2008
T2 - 2008 8th IEEE International Conference on Automatic Face and Gesture Recognition, FG 2008
Y2 - 17 September 2008 through 19 September 2008
ER -