An ASM fitting method based on machine learning that provides a robust parameter initialization for AAM fitting

Matthias Wimmer*, Shinya Fujie, Freek Stulp, Tetsunori Kobayashi, Bernd Radig

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Due to their use of information contained in texture, Active Appearance Models (AAM) generally outperform Active Shape Models (ASM) in terms of fitting accuracy. Although many extensions and improvements over the original AAM have been proposed, on of the main drawbacks of AAMs remains its dependence on good initial model parameters to achieve accurate fitting results. In this paper, we determine the initial model parameters for AAM fitting with ASM fitting, and use machine learning techniques to improve the scope and accuracy of ASM fitting. Combining the precision of AAM fitting with the large radius of convergence of learned ASM fitting improves the results by an order of magnitude, as our empirical evaluation n a database of publicly available benchmark images demonstrates.

Original languageEnglish
Title of host publication2008 8th IEEE International Conference on Automatic Face and Gesture Recognition, FG 2008
DOIs
Publication statusPublished - 2008
Event2008 8th IEEE International Conference on Automatic Face and Gesture Recognition, FG 2008 - Amsterdam, Netherlands
Duration: 2008 Sept 172008 Sept 19

Publication series

Name2008 8th IEEE International Conference on Automatic Face and Gesture Recognition, FG 2008

Conference

Conference2008 8th IEEE International Conference on Automatic Face and Gesture Recognition, FG 2008
Country/TerritoryNetherlands
CityAmsterdam
Period08/9/1708/9/19

ASJC Scopus subject areas

  • Computer Vision and Pattern Recognition
  • Human-Computer Interaction
  • Electrical and Electronic Engineering

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