Analysis of crystalline nano structures embedded in amorphous films by selected area nano diffraction in a Cs-corrected TEM

J. Yamasaki*, S. Morishita, N. Tanaka, A. Hirata, Y. Hirotsu, T. Kato

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)760-761
Number of pages2
JournalMicroscopy and Microanalysis
Issue numberSUPPL. 2
Publication statusPublished - 2009 Jul
Externally publishedYes

ASJC Scopus subject areas

  • Instrumentation

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