Analysis of local lattice strain around oxygen precipitates in silicon crystals using CBED technique

Mitsuharu Yonemura*, Koji Sueoka, Kazuhito Kamei

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

21 Citations (Scopus)


Oxygen precipitates (SiOx) in Czochralski-grown silicon single crystals (CZ-Si) have been used for the `getter' sink for impurities introduced during the LSI wafer manufacturing process. In order to understand the `gettering' phenomena, lattice strain fields around the precipitates have been measured quantitatively using convergent beam electron diffraction (CBED). The local lattice strain can be measured from higher order Laue zone (HOLZ) patterns since the HOLZ pattern in the bright field disk is sensitive to the lattice displacement. As a result, a tetragonal distortion of silicon lattices was found in the vicinity of a platelet of an oxygen precipitate. That is, the strain due to the displacement of (001)Si planes is compressive along the direction normal to [001]Si and is tensile along the direction parallel to [001]Si. The normal strain is estimated to be about 0.3% near the flat plane of the platelet and 0.1% near the edge of the platelet whose edge length is about 500 nm. The results are discussed, and compared to those from the finite element method (FEM) simulation.

Original languageEnglish
Pages (from-to)208-213
Number of pages6
JournalApplied Surface Science
Publication statusPublished - 1998 Jun
Externally publishedYes

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Surfaces, Coatings and Films
  • Condensed Matter Physics


Dive into the research topics of 'Analysis of local lattice strain around oxygen precipitates in silicon crystals using CBED technique'. Together they form a unique fingerprint.

Cite this