Antiferrodistortive structural phase transition in compressively-strained epitaxial SrTiO3 film grown on (La, Sr)(Al, Ta)O3 substrate

T. Yamada; T. Kiguchi; A. K. Tagantsev; H. Morioka; T. Iijima; H. Ohsumi; S. Kimura; M. Osada; N. Setter; H. Funakubo

doi:10.1080/10584587.2010.488545

Antiferrodistortive structural phase transition in compressively-strained epitaxial SrTiO₃ film grown on (La, Sr)(Al, Ta)O₃ substrate

T. Yamada^*, T. Kiguchi, A. K. Tagantsev, H. Morioka, T. Iijima, H. Ohsumi, S. Kimura, M. Osada, N. Setter, H. Funakubo

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

6 Citations (Scopus)

Abstract

(001)-epitaxial SrTiO₃ films were grown on (La, Sr)(Al, Ta)O₃ substrates for investigating the impact of biaxial strain on the antiferrodistortive (AFD) structural phase transition in SrTiO₃. The films were fully constrained by the substrates, which resulted in the large in-plane compressive strain of -0.9%. The AFD transition temperature estimated using temperature controlled x-ray diffraction and transmission electron microscope was over 150K higher than the theoretical prediction, but rather supported the experimental results reported on SrTiO₃ films on LaAlO₃ substrates.

Original language	English
Pages (from-to)	57-62
Number of pages	6
Journal	Integrated Ferroelectrics
Volume	115
Issue number	1
DOIs	https://doi.org/10.1080/10584587.2010.488545
Publication status	Published - 2010
Externally published	Yes

Keywords

strain
strontium titanate
Structural phase transition

ASJC Scopus subject areas

Electrical and Electronic Engineering
Ceramics and Composites
Electronic, Optical and Magnetic Materials
Materials Chemistry
Condensed Matter Physics
Control and Systems Engineering

Access to Document

10.1080/10584587.2010.488545

Cite this

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title = "Antiferrodistortive structural phase transition in compressively-strained epitaxial SrTiO3 film grown on (La, Sr)(Al, Ta)O3 substrate",

abstract = "(001)-epitaxial SrTiO3 films were grown on (La, Sr)(Al, Ta)O3 substrates for investigating the impact of biaxial strain on the antiferrodistortive (AFD) structural phase transition in SrTiO3. The films were fully constrained by the substrates, which resulted in the large in-plane compressive strain of -0.9%. The AFD transition temperature estimated using temperature controlled x-ray diffraction and transmission electron microscope was over 150K higher than the theoretical prediction, but rather supported the experimental results reported on SrTiO3 films on LaAlO3 substrates.",

keywords = "strain, strontium titanate, Structural phase transition",

author = "T. Yamada and T. Kiguchi and Tagantsev, {A. K.} and H. Morioka and T. Iijima and H. Ohsumi and S. Kimura and M. Osada and N. Setter and H. Funakubo",

year = "2010",

doi = "10.1080/10584587.2010.488545",

language = "English",

volume = "115",

pages = "57--62",

journal = "Integrated Ferroelectrics",

issn = "1058-4587",

publisher = "Taylor and Francis Ltd.",

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TY - JOUR

T1 - Antiferrodistortive structural phase transition in compressively-strained epitaxial SrTiO3 film grown on (La, Sr)(Al, Ta)O3 substrate

AU - Yamada, T.

AU - Kiguchi, T.

AU - Tagantsev, A. K.

AU - Morioka, H.

AU - Iijima, T.

AU - Ohsumi, H.

AU - Kimura, S.

AU - Osada, M.

AU - Setter, N.

AU - Funakubo, H.

PY - 2010

Y1 - 2010

N2 - (001)-epitaxial SrTiO3 films were grown on (La, Sr)(Al, Ta)O3 substrates for investigating the impact of biaxial strain on the antiferrodistortive (AFD) structural phase transition in SrTiO3. The films were fully constrained by the substrates, which resulted in the large in-plane compressive strain of -0.9%. The AFD transition temperature estimated using temperature controlled x-ray diffraction and transmission electron microscope was over 150K higher than the theoretical prediction, but rather supported the experimental results reported on SrTiO3 films on LaAlO3 substrates.

AB - (001)-epitaxial SrTiO3 films were grown on (La, Sr)(Al, Ta)O3 substrates for investigating the impact of biaxial strain on the antiferrodistortive (AFD) structural phase transition in SrTiO3. The films were fully constrained by the substrates, which resulted in the large in-plane compressive strain of -0.9%. The AFD transition temperature estimated using temperature controlled x-ray diffraction and transmission electron microscope was over 150K higher than the theoretical prediction, but rather supported the experimental results reported on SrTiO3 films on LaAlO3 substrates.

KW - strain

KW - strontium titanate

KW - Structural phase transition

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