Atomically Controlled Surfaces, Interfaces and Nanostructures/Scanning Probe Microscopy

Takuji Takahashi; Daisuke Fujita; Hirokazu Fukidome; Ken Ichi Fukui; Hiroki Hibino; Masami Kageshima; Tadahiro Komeda; Ken Nakajima; Makoto Nakamura; Tomonobu Nakayama; Hiroshi Nohira; Kaoru Sasakawa; Naruo Sasaki; Koji Sumitomo; Takayuki Uchihashi; Takanobu Watanabe; Yoichi Yamada

doi:10.7567/1347-4065/ab2864

Atomically Controlled Surfaces, Interfaces and Nanostructures/Scanning Probe Microscopy

Takuji Takahashi, Daisuke Fujita, Hirokazu Fukidome, Ken Ichi Fukui, Hiroki Hibino, Masami Kageshima, Tadahiro Komeda, Ken Nakajima, Makoto Nakamura, Tomonobu Nakayama, Hiroshi Nohira, Kaoru Sasakawa, Naruo Sasaki, Koji Sumitomo, Takayuki Uchihashi, Takanobu Watanabe, Yoichi Yamada

School of Fundamental Science and Engineering

Research output: Contribution to journal › Editorial › peer-review

Original language	English
Article number	SI0001
Journal	Japanese journal of applied physics
Volume	58
Issue number	SI
DOIs	https://doi.org/10.7567/1347-4065/ab2864
Publication status	Published - 2019

ASJC Scopus subject areas

Engineering(all)
Physics and Astronomy(all)

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10.7567/1347-4065/ab2864

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Takahashi, T., Fujita, D., Fukidome, H., Fukui, K. I., Hibino, H., Kageshima, M., Komeda, T., Nakajima, K., Nakamura, M., Nakayama, T., Nohira, H., Sasakawa, K., Sasaki, N., Sumitomo, K., Uchihashi, T., Watanabe, T., & Yamada, Y. (2019). Atomically Controlled Surfaces, Interfaces and Nanostructures/Scanning Probe Microscopy. Japanese journal of applied physics, 58(SI), Article SI0001. https://doi.org/10.7567/1347-4065/ab2864

Takahashi, T, Fujita, D, Fukidome, H, Fukui, KI, Hibino, H, Kageshima, M, Komeda, T, Nakajima, K, Nakamura, M, Nakayama, T, Nohira, H, Sasakawa, K, Sasaki, N, Sumitomo, K, Uchihashi, T, Watanabe, T & Yamada, Y 2019, 'Atomically Controlled Surfaces, Interfaces and Nanostructures/Scanning Probe Microscopy', Japanese journal of applied physics, vol. 58, no. SI, SI0001. https://doi.org/10.7567/1347-4065/ab2864

@article{f1ae8f536b944af5a352b362de570e39,

title = "Atomically Controlled Surfaces, Interfaces and Nanostructures/Scanning Probe Microscopy",

author = "Takuji Takahashi and Daisuke Fujita and Hirokazu Fukidome and Fukui, {Ken Ichi} and Hiroki Hibino and Masami Kageshima and Tadahiro Komeda and Ken Nakajima and Makoto Nakamura and Tomonobu Nakayama and Hiroshi Nohira and Kaoru Sasakawa and Naruo Sasaki and Koji Sumitomo and Takayuki Uchihashi and Takanobu Watanabe and Yoichi Yamada",

year = "2019",

doi = "10.7567/1347-4065/ab2864",

language = "English",

volume = "58",

journal = "Japanese journal of applied physics",

issn = "0021-4922",

publisher = "Japan Society of Applied Physics",

number = "SI",

}

TY - JOUR

T1 - Atomically Controlled Surfaces, Interfaces and Nanostructures/Scanning Probe Microscopy

AU - Takahashi, Takuji

AU - Fujita, Daisuke

AU - Fukidome, Hirokazu

AU - Fukui, Ken Ichi

AU - Hibino, Hiroki

AU - Kageshima, Masami

AU - Komeda, Tadahiro

AU - Nakajima, Ken

AU - Nakamura, Makoto

AU - Nakayama, Tomonobu

AU - Nohira, Hiroshi

AU - Sasakawa, Kaoru

AU - Sasaki, Naruo

AU - Sumitomo, Koji

AU - Uchihashi, Takayuki

AU - Watanabe, Takanobu

AU - Yamada, Yoichi

PY - 2019

Y1 - 2019

UR - http://www.scopus.com/inward/record.url?scp=85072830082&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85072830082&partnerID=8YFLogxK

U2 - 10.7567/1347-4065/ab2864

DO - 10.7567/1347-4065/ab2864

M3 - Editorial

AN - SCOPUS:85072830082

SN - 0021-4922

VL - 58

JO - Japanese journal of applied physics

JF - Japanese journal of applied physics

IS - SI

M1 - SI0001

ER -

Atomically Controlled Surfaces, Interfaces and Nanostructures/Scanning Probe Microscopy

ASJC Scopus subject areas

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