TY - GEN
T1 - Autonomous refresh of floating body cell (FBC)
AU - Ohsawa, Takashi
AU - Fukuda, Ryo
AU - Higashi, Tomoki
AU - Fujita, Katsuyuki
AU - Matsuoka, Fumiyoshi
AU - Shino, Tomoaki
AU - Furuhashi, Hironobu
AU - Minami, Yoshihiro
AU - Nakajima, Hiroomi
AU - Hamamoto, Takeshi
AU - Watanabe, Yohji
AU - Nitayama, Akihiro
AU - Furuyama, Tohru
PY - 2008
Y1 - 2008
N2 - Physics of autonomous refresh of FBC is presented. Current input to the floating body by impact ionization and output by charge pumping can balance to make FBC refresh by itself without sense amplifier operation. Thanks to this feature, multiple cells on a BL can be refreshed simultaneously, leading to a drastic reduction of BL charging current compared to the conventional refresh. 600μA refresh current for 1G-bit memory is achieved in 32nm technology node with 4ms retention time. If gate direct tunneling current is used as output, FBC can realize static RAM without periodical refresh when retaining data.
AB - Physics of autonomous refresh of FBC is presented. Current input to the floating body by impact ionization and output by charge pumping can balance to make FBC refresh by itself without sense amplifier operation. Thanks to this feature, multiple cells on a BL can be refreshed simultaneously, leading to a drastic reduction of BL charging current compared to the conventional refresh. 600μA refresh current for 1G-bit memory is achieved in 32nm technology node with 4ms retention time. If gate direct tunneling current is used as output, FBC can realize static RAM without periodical refresh when retaining data.
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U2 - 10.1109/IEDM.2008.4796819
DO - 10.1109/IEDM.2008.4796819
M3 - Conference contribution
AN - SCOPUS:64549104147
SN - 9781424423781
T3 - Technical Digest - International Electron Devices Meeting, IEDM
BT - 2008 IEEE International Electron Devices Meeting, IEDM 2008
T2 - 2008 IEEE International Electron Devices Meeting, IEDM 2008
Y2 - 15 December 2008 through 17 December 2008
ER -