Backscattering correction for quantitative Auger analysis III. A simple functional representation of electron backscattering factors

S. Ichimura; R. Shimizu; J. P. Langeron

doi:10.1016/0039-6028(83)90791-4

Backscattering correction for quantitative Auger analysis III. A simple functional representation of electron backscattering factors

S. Ichimura^*, R. Shimizu, J. P. Langeron

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

102 Citations (Scopus)

Abstract

Backscattering factors for quantitative Auger analysis which were obtained by Monte Carlo calculations were analytically represented by using simple functions. This should enable the backscattering correction procedure in quantitative Auger analysis to be of more practical use.

Original language	English
Pages (from-to)	L49-L54
Journal	Surface Science
Volume	124
Issue number	2-3
DOIs	https://doi.org/10.1016/0039-6028(83)90791-4
Publication status	Published - 1983 Jan 2
Externally published	Yes

ASJC Scopus subject areas

Condensed Matter Physics
Surfaces and Interfaces
Surfaces, Coatings and Films
Materials Chemistry

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10.1016/0039-6028(83)90791-4

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title = "Backscattering correction for quantitative Auger analysis III. A simple functional representation of electron backscattering factors",

abstract = "Backscattering factors for quantitative Auger analysis which were obtained by Monte Carlo calculations were analytically represented by using simple functions. This should enable the backscattering correction procedure in quantitative Auger analysis to be of more practical use.",

author = "S. Ichimura and R. Shimizu and Langeron, {J. P.}",

year = "1983",

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AU - Ichimura, S.

AU - Shimizu, R.

AU - Langeron, J. P.

PY - 1983/1/2

Y1 - 1983/1/2

N2 - Backscattering factors for quantitative Auger analysis which were obtained by Monte Carlo calculations were analytically represented by using simple functions. This should enable the backscattering correction procedure in quantitative Auger analysis to be of more practical use.

AB - Backscattering factors for quantitative Auger analysis which were obtained by Monte Carlo calculations were analytically represented by using simple functions. This should enable the backscattering correction procedure in quantitative Auger analysis to be of more practical use.

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JO - Surface Science

JF - Surface Science

IS - 2-3

ER -

Backscattering correction for quantitative Auger analysis III. A simple functional representation of electron backscattering factors

Abstract

ASJC Scopus subject areas

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