Beam profile indicator for swift heavy ions using phosphor afterglow

T. Z. Zhan; C. N. Xu; H. Yamada; Y. Terasawa; L. Zhang; H. Iwase; M. Kawai

doi:10.1063/1.4739407

Beam profile indicator for swift heavy ions using phosphor afterglow

T. Z. Zhan, C. N. Xu, H. Yamada, Y. Terasawa, L. Zhang, H. Iwase, M. Kawai

Research output: Contribution to journal › Article › peer-review

7 Citations (Scopus)

Abstract

In this letter, we report a beam profile indicator for swift heavy ions (SHIs) which utilizes the afterglow of phosphors. Clear marks are left on SrAl₂O₄:Eu²⁺ and CaSrAl₂Si ₂O₈:Eu²⁺ samples by SHI irradiation through a permanent change of their afterglow intensity. The afterglow intensity of the SHI-irradiated areas has a Gaussian distribution. Moreover, afterglow intensity and irradiation fluence are linearly related, indicating that this type of indicator has good dose linearity. The results suggest that long-lasting phosphors are promising SHI beam profile indicators with high spatial resolution.

Original language	English
Article number	032116
Journal	AIP Advances
Volume	2
Issue number	3
DOIs	https://doi.org/10.1063/1.4739407
Publication status	Published - 2012 Sept
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy(all)

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10.1063/1.4739407

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title = "Beam profile indicator for swift heavy ions using phosphor afterglow",

abstract = "In this letter, we report a beam profile indicator for swift heavy ions (SHIs) which utilizes the afterglow of phosphors. Clear marks are left on SrAl2O4:Eu2+ and CaSrAl2Si 2O8:Eu2+ samples by SHI irradiation through a permanent change of their afterglow intensity. The afterglow intensity of the SHI-irradiated areas has a Gaussian distribution. Moreover, afterglow intensity and irradiation fluence are linearly related, indicating that this type of indicator has good dose linearity. The results suggest that long-lasting phosphors are promising SHI beam profile indicators with high spatial resolution.",

author = "Zhan, {T. Z.} and Xu, {C. N.} and H. Yamada and Y. Terasawa and L. Zhang and H. Iwase and M. Kawai",

note = "Funding Information: This work was partially supported by the JST CREST program. We gratefully acknowledge the researchers and technical staff at AIST, particularly Dr. Xiaoyan Fu, Dr. Chenshu Li, Ms. Etsuko Kawasaki, and Mr. Masayoshi Kubo, for assisting in this work.",

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T1 - Beam profile indicator for swift heavy ions using phosphor afterglow

AU - Zhan, T. Z.

AU - Xu, C. N.

AU - Yamada, H.

AU - Terasawa, Y.

AU - Zhang, L.

AU - Iwase, H.

AU - Kawai, M.

N1 - Funding Information: This work was partially supported by the JST CREST program. We gratefully acknowledge the researchers and technical staff at AIST, particularly Dr. Xiaoyan Fu, Dr. Chenshu Li, Ms. Etsuko Kawasaki, and Mr. Masayoshi Kubo, for assisting in this work.

PY - 2012/9

Y1 - 2012/9

N2 - In this letter, we report a beam profile indicator for swift heavy ions (SHIs) which utilizes the afterglow of phosphors. Clear marks are left on SrAl2O4:Eu2+ and CaSrAl2Si 2O8:Eu2+ samples by SHI irradiation through a permanent change of their afterglow intensity. The afterglow intensity of the SHI-irradiated areas has a Gaussian distribution. Moreover, afterglow intensity and irradiation fluence are linearly related, indicating that this type of indicator has good dose linearity. The results suggest that long-lasting phosphors are promising SHI beam profile indicators with high spatial resolution.

AB - In this letter, we report a beam profile indicator for swift heavy ions (SHIs) which utilizes the afterglow of phosphors. Clear marks are left on SrAl2O4:Eu2+ and CaSrAl2Si 2O8:Eu2+ samples by SHI irradiation through a permanent change of their afterglow intensity. The afterglow intensity of the SHI-irradiated areas has a Gaussian distribution. Moreover, afterglow intensity and irradiation fluence are linearly related, indicating that this type of indicator has good dose linearity. The results suggest that long-lasting phosphors are promising SHI beam profile indicators with high spatial resolution.

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Beam profile indicator for swift heavy ions using phosphor afterglow

Abstract

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