Capacitance-voltage characterization of metal-insulator-semiconductor capacitors formed on wide-bandgap semiconductors with deep dopants such as diamond

Atsushi Hiraiwa*, Satoshi Okubo, Masahiko Ogura, Yu Fu, Hiroshi Kawarada

*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

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