TY - GEN
T1 - Case Study
T2 - 27th IEEE International Symposium on Software Reliability Engineering Workshops, ISSREW 2016
AU - Honda, Kiyoshi
AU - Nakamura, Nobuhiro
AU - Washizaki, Hironori
AU - Fukazawa, Yoshiaki
N1 - Publisher Copyright:
© 2016 IEEE.
PY - 2016/12/16
Y1 - 2016/12/16
N2 - We propose a method to compare software products developed by the same company in the same domain. Our method, which measures the time series of the number of detected faults, employs software reliability growth models (SRGMs). SRGMs describe the relations between faults and the time necessary to detect them. Herein our method is extended to classify past projects for comparison to current projects to help managers and developers decide when to end the test phases or release a project. Past projects are classified by three parameters: lines of code, number of test cases, and test density. Then SRGM is applied. Our extended method is applied to the datasets for nine projects developed by Sumitomo Electric Industries, Ltd. Classification by test density produces the best results.
AB - We propose a method to compare software products developed by the same company in the same domain. Our method, which measures the time series of the number of detected faults, employs software reliability growth models (SRGMs). SRGMs describe the relations between faults and the time necessary to detect them. Herein our method is extended to classify past projects for comparison to current projects to help managers and developers decide when to end the test phases or release a project. Past projects are classified by three parameters: lines of code, number of test cases, and test density. Then SRGM is applied. Our extended method is applied to the datasets for nine projects developed by Sumitomo Electric Industries, Ltd. Classification by test density produces the best results.
KW - Empirical study
KW - Faults prediction
KW - Software Reliability Growth Model
UR - http://www.scopus.com/inward/record.url?scp=85009733686&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85009733686&partnerID=8YFLogxK
U2 - 10.1109/ISSREW.2016.45
DO - 10.1109/ISSREW.2016.45
M3 - Conference contribution
AN - SCOPUS:85009733686
T3 - Proceedings - 2016 IEEE 27th International Symposium on Software Reliability Engineering Workshops, ISSREW 2016
SP - 41
EP - 44
BT - Proceedings - 2016 IEEE 27th International Symposium on Software Reliability Engineering Workshops, ISSREW 2016
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 23 October 2016 through 27 October 2016
ER -