CdTe and CdZnTe detectors for timing measurements

Yuu Okada*, Tadayuki Takahashi, Goro Sato, Shin Watanabe, Kazuhiro Nakazawa, Kunishiro Mori, Kazuo Makishima

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    26 Citations (Scopus)


    We measured timing properties of CdTe and CdZnTe semiconductor detectors with planar configuration. We developed a new method to evaluate their performance in timing resolution utilizing an 241Am-doped plastic scintillator. We confirmed that the low mobility and short lifetime of holes are major obstacles to their timing resolution. However, their timing properties can be very much improved, either by applying a high electric field that increases the carrier speed or by selecting those events which are dominated by the electron signal. We demonstrated the latter through a pulse-shape discrimination technique using two different integration time constants. In conjunction with a newly developed CdTe diode, we obtained a superior timing resolution of 5.8 ns. We also discussed the application of CdTe to positron emission tomography (PET), employing the standard 511 keV gamma-gamma coincidence method. We confirmed that a geometrical configuration in which the electrodes are parallel to the incident γ-rays gives about three times better timing response than a geometry when the electrodes are perpendicular to the γ-ray beam.

    Original languageEnglish
    Pages (from-to)1986-1992
    Number of pages7
    JournalIEEE Transactions on Nuclear Science
    Volume49 I
    Issue number4
    Publication statusPublished - 2002 Aug


    • CdTe
    • CdZnTe
    • Timing

    ASJC Scopus subject areas

    • Electrical and Electronic Engineering
    • Nuclear Energy and Engineering


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