TY - JOUR
T1 - Change in surface morphology of polytetrafluoroethylene by reactive ion etching
AU - Takahashi, Tomohiro
AU - Hirano, Yuki
AU - Takasawa, Yuya
AU - Gowa, Tomoko
AU - Fukutake, Naoyuki
AU - Oshima, Akihiro
AU - Tagawa, Seiichi
AU - Washio, Masakazu
N1 - Funding Information:
A part of this work was supported by “Nanotechnology network project (Handai Multi Functional Nanofoundry)” of the Ministry of Education, Culture, Sports, Science and Technology (MEXT). A part of this work was supported by High-Tech Research Center Project of MEXT HRC707 .
PY - 2011/2
Y1 - 2011/2
N2 - Polytetrafluoroethylene (PTFE) was exposed to Ar, CF4, N2 and O2 plasmas using a reactive ion etching facility. After the exposure, the change in the surface morphology of PTFE was examined and characterization studies were performed for the etching rate, surface roughness, radical yields, chemical structures, water repellency and so on. The etching rates of Ar, CF4, N2 and O2 plasmas were 0.58, 7.2, 4.4 and 17γm/h, respectively. It was observed that needle-like nano-fiber structures on the surface were irregularly fabricated by the CF4 plasma. In addition, when the water repellency of exposed samples was evaluated by contact angle, they showed super-hydrophobic properties: contact angle over 150°.
AB - Polytetrafluoroethylene (PTFE) was exposed to Ar, CF4, N2 and O2 plasmas using a reactive ion etching facility. After the exposure, the change in the surface morphology of PTFE was examined and characterization studies were performed for the etching rate, surface roughness, radical yields, chemical structures, water repellency and so on. The etching rates of Ar, CF4, N2 and O2 plasmas were 0.58, 7.2, 4.4 and 17γm/h, respectively. It was observed that needle-like nano-fiber structures on the surface were irregularly fabricated by the CF4 plasma. In addition, when the water repellency of exposed samples was evaluated by contact angle, they showed super-hydrophobic properties: contact angle over 150°.
KW - PTFE
KW - Plasma
KW - Reactive ion etching
KW - Water repellency
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U2 - 10.1016/j.radphyschem.2010.07.042
DO - 10.1016/j.radphyschem.2010.07.042
M3 - Article
AN - SCOPUS:78649329794
SN - 0969-806X
VL - 80
SP - 253
EP - 256
JO - Radiation Physics and Chemistry
JF - Radiation Physics and Chemistry
IS - 2
ER -