TY - GEN
T1 - Characteristics of highly stacked quantum dot laser fabricated on InP(311)B substrate
AU - Akahane, Kouichi
AU - Yamamoto, Naokatsu
AU - Kawanishi, Tetsuya
PY - 2009
Y1 - 2009
N2 - We fabricated broad-area laser diodes containing highly stacked InAs quantum dots by using the strain-compensation technique. The diodes exhibited laser emission at 1529 nm in the pulsed mode with a large characteristic temperature of 113K.
AB - We fabricated broad-area laser diodes containing highly stacked InAs quantum dots by using the strain-compensation technique. The diodes exhibited laser emission at 1529 nm in the pulsed mode with a large characteristic temperature of 113K.
UR - http://www.scopus.com/inward/record.url?scp=70349478688&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=70349478688&partnerID=8YFLogxK
U2 - 10.1109/ICIPRM.2009.5012424
DO - 10.1109/ICIPRM.2009.5012424
M3 - Conference contribution
AN - SCOPUS:70349478688
SN - 9781424434336
T3 - Conference Proceedings - International Conference on Indium Phosphide and Related Materials
SP - 73
EP - 74
BT - IEEE International Conference on Indium Phosphide and Related Materials, IPRM 2009
T2 - IEEE International Conference on Indium Phosphide and Related Materials, IPRM 2009
Y2 - 10 May 2009 through 14 May 2009
ER -