Abstract
An electron-spin-resonance (ESR) study was made on the defect centers induced by vacuum-ultraviolet (vuv) laser (7.9-eV) irradiation in high-purity silica glasses. We observed two types of ESR spectra, each consisting of a concentric pair of four-line peaks, in low-OH oxygen-surplus silica produced with plasma methods. Spin-Hamiltonian parameters determined by computer simulation of the experimental ESR line shapes are consistent with oxy-radicals of chlorine. The observed ClOx (x=2,3) radicals are considered to be due to the reaction between chlorine and oxygen, which were both produced by vuv-laser irradiation.
| Original language | English |
|---|---|
| Pages (from-to) | 8073-8079 |
| Number of pages | 7 |
| Journal | Physical Review B |
| Volume | 46 |
| Issue number | 13 |
| DOIs | |
| Publication status | Published - 1992 Jan 1 |
ASJC Scopus subject areas
- Condensed Matter Physics