Characterization of locally modified diamond surface using Kelvin probe force microscope

Minoru Tachiki*, Yu Kaibara, Yu Sumikawa, Masatsugu Shigeno, Hirohumi Kanazawa, Tokishige Banno, Kwang Soup Song, Hitoshi Umezawa, Hiroshi Kawarada

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

56 Citations (Scopus)


The surface potential difference between an H-terminated surface and a locally oxidized diamond surface produced by an atomic force microprobe was investigated using a Kelvin probe force microscope. The potential of the H-terminated diamond surface was observed to be ∼0.1 V higher than that of the oxidized diamond surface. The surface potential difference can be interpreted in terms of the positions of the vacuum level, the Fermi level, and the conduction and valence band edges, when negative electron affinity and p-type surface conduction are assumed on the H-terminated diamond surface. The surface dipole induced by the electronegativity differences between the surface atoms of the diamond affects the difference in the surface potential between the two surfaces.

Original languageEnglish
Pages (from-to)207-212
Number of pages6
JournalSurface Science
Issue number2-3
Publication statusPublished - 2005 May 1


  • AFM
  • Diamond
  • Hydrogen termination
  • KFM
  • Local oxidation
  • Surface charge
  • Surface conduction

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry


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