Characterization of the local layer structure of a narrow wall in a surface stabilized ferroelectric liquid crystal using synchrotron X-ray micro-diffraction

Synchrotron X-ray microbeam small angle diffraction experiments were carried out for the characterization of the local layer structure of the narrow wall of a zig-zag defect in a surface stabilized ferroelectric liquid crystal cell. A series of the rocking curve (ω) and the azimuthal (χ) intensity distribution profiles were measured as a function of the vertical position across the narrow wall. The local layer was deflected at the wall in the χ direction. For the inclined narrow wall making an angle of a few degrees to 10° with respect to the rubbing direction, the deflected layer bent in both ω and χ directions. At the narrow wall running parallel to the rubbing direction, the layer bent only in the ω direction. The local layer structure was discussed in relation to the surface anchoring effect and a uniformly bent layer structure was proposed to explain experimental results.