Clues for modeling and diagnosing open faults with considering adjacent lines

Hiroshi Takahashi*, Yoshinobu Higami, Shuhei Kadoyama, Takashi Aikyo, Yuzo Takamatsu, Koji Yamazaki, Toshiyuki Tsutsumi, Hiroyuki Yotsuyanagi, Masaki Hashizume

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

15 Citations (Scopus)


Under the modern manufacturing technologies, the open defect is one of the significant issues to maintain the reliability of DSM circuits. However, the modeling and techniques for test and diagnosis for open faults have not been established yet. In this paper, we give an important clue for modeling an open fault with considering the affects of adjacent lines. Firstly, we use computer simulations to analyze the defective behaviors of a line with the open defect. From the simulation results, we propose a new open fault model that is excited depending on the logic values at the adjacent lines assigned by a test. Next, we propose a diagnosis method that uses the pass/fail information to deduce the candidate open fault. Finally, experimental results show that the proposed method is able to diagnose the open faults with good resolution. It takes about 6 minutes to diagnose the open fault on the large circuit (2M gates).

Original languageEnglish
Title of host publicationProceedings of the 16th Asian Test Symposium, ATS 2007
Number of pages6
Publication statusPublished - 2007
Externally publishedYes
Event16th Asian Test Symposium, ATS 2007 - Beijing, China
Duration: 2007 Oct 82007 Oct 11

Publication series

NameProceedings of the Asian Test Symposium
ISSN (Print)1081-7735


Conference16th Asian Test Symposium, ATS 2007

ASJC Scopus subject areas

  • Electrical and Electronic Engineering


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