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Clues for modeling and diagnosing open faults with considering adjacent lines
Hiroshi Takahashi*, Yoshinobu Higami, Shuhei Kadoyama, Takashi Aikyo, Yuzo Takamatsu, Koji Yamazaki, Toshiyuki Tsutsumi, Hiroyuki Yotsuyanagi, Masaki Hashizume
*Corresponding author for this work
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
3
Citations
(Scopus)