Comparison of broadband impedance spectroscopy and time domain reflectometry for locating cable degradation

Naoshi Hirai*, Takayuki Yamada, Yoshimichi Ohki

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

32 Citations (Scopus)

Abstract

A new method called the broadband impedance spectroscopy (BIS), which is a kind of frequency domain reflectometry, is being developed as a reliable method for locating a degraded portion of a low voltage cable. The sensitivity of the BIS method is compared to that of the time domain reflectometry (TDR). In the first case, the sheath and insulation of a 50-m-long polyvinyl chloride insulated cable were partially peeled off. In the second case, cables insulated with silicone rubber, flame-retardant ethylene propylene rubber, or cross-linked polyethylene, each about 25 m long, were aged simultaneously by heat and γ-irradiation in air. In both two cases, a clear peak indicating the damaged or aged portion appears in the BIS measurement, while no such a peak appears in the TDR measurement. Therefore, the BIS method is much superior to the TDR method for locating a degraded portion in a cable.

Original languageEnglish
Title of host publicationProceedings of 2012 IEEE International Conference on Condition Monitoring and Diagnosis, CMD 2012
Pages229-232
Number of pages4
DOIs
Publication statusPublished - 2012 Dec 1
Event2012 IEEE International Conference on Condition Monitoring and Diagnosis, CMD 2012 - Bali, Indonesia
Duration: 2012 Sept 232012 Sept 27

Publication series

NameProceedings of 2012 IEEE International Conference on Condition Monitoring and Diagnosis, CMD 2012

Conference

Conference2012 IEEE International Conference on Condition Monitoring and Diagnosis, CMD 2012
Country/TerritoryIndonesia
CityBali
Period12/9/2312/9/27

Keywords

  • Broadband impedance spectroscopy
  • diagnosis
  • frequency domain reflectometry
  • insulation
  • nuclear power plant
  • time domain reflectometry

ASJC Scopus subject areas

  • Safety, Risk, Reliability and Quality

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