TY - GEN
T1 - Comparison of location abilities of degradation in a polymer-insulated cable between frequency domain reflectometry and line resonance analysis
AU - Ohki, Yoshimichi
AU - Hirai, Naoshi
N1 - Publisher Copyright:
© 2016 IEEE.
PY - 2016/12/27
Y1 - 2016/12/27
N2 - The ability of locating a degraded portion in a double-core cable insulated with silicone rubber (SiR) or in a coaxial cable insulated with low-density polyethylene (LDPE) was compared between a system based on frequency domain reflectometry (FDR) being developed by the authors and a commercially available system called line resonance analysis (LIRA). Both the FDR and the LIRA methods cannot detect the degradation of SiR before its further use becomes uncommend-able in a nuclear power plant. However, for location trials of the degraded portion in the LDPE coaxial cable, the FDR method showed a higher sensitivity and a better resolution than LIRA.
AB - The ability of locating a degraded portion in a double-core cable insulated with silicone rubber (SiR) or in a coaxial cable insulated with low-density polyethylene (LDPE) was compared between a system based on frequency domain reflectometry (FDR) being developed by the authors and a commercially available system called line resonance analysis (LIRA). Both the FDR and the LIRA methods cannot detect the degradation of SiR before its further use becomes uncommend-able in a nuclear power plant. However, for location trials of the degraded portion in the LDPE coaxial cable, the FDR method showed a higher sensitivity and a better resolution than LIRA.
KW - aging
KW - cable
KW - frequency domain reflectometry
KW - low-density polyethylene
KW - silicone rubber
UR - http://www.scopus.com/inward/record.url?scp=85010445018&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85010445018&partnerID=8YFLogxK
U2 - 10.1109/ICHVE.2016.7800602
DO - 10.1109/ICHVE.2016.7800602
M3 - Conference contribution
AN - SCOPUS:85010445018
T3 - ICHVE 2016 - 2016 IEEE International Conference on High Voltage Engineering and Application
BT - ICHVE 2016 - 2016 IEEE International Conference on High Voltage Engineering and Application
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 5th IEEE International Conference on High Voltage Engineering and Application, ICHVE 2016
Y2 - 19 September 2016 through 22 September 2016
ER -