Contact probe card with large overdrive

Gunsei Kimoto*, Takehiro Watanabe, Souta Matsusaka, Takaharu Kuroda, Mikiko Saito

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)


In this paper, we present a new contact probe card with an insulating resin film that can achieve large overdrive. The probe pins were manufactured using Be-Cu through etching and silkscreen polyimide printing. It was confirmed that the probes have a long life expectancy because they act within the thresholds of elastic deformation. The proposed assembly technology allows us to achieve highly accurate probe units with a narrow pitch and a probe thickness of only 28 μm.

Original languageEnglish
Title of host publicationStudent Posters (General) - 218th ECS Meeting
PublisherElectrochemical Society Inc.
Number of pages11
ISBN (Electronic)9781566778770
ISBN (Print)9781607682271
Publication statusPublished - 2010
EventGeneral Student Poster Session - 218th ECS Meeting - Las Vegas, NV, United States
Duration: 2010 Oct 102010 Oct 15

Publication series

NameECS Transactions
ISSN (Print)1938-5862
ISSN (Electronic)1938-6737


ConferenceGeneral Student Poster Session - 218th ECS Meeting
Country/TerritoryUnited States
CityLas Vegas, NV

ASJC Scopus subject areas

  • Engineering(all)


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