TY - JOUR
T1 - Controlled strong excitation of silicon as a step towards processing materials at sub-nanometer precision
AU - Dinh, Thanh Hung
AU - Medvedev, Nikita
AU - Ishino, Masahiko
AU - Kitamura, Toshiyuki
AU - Hasegawa, Noboru
AU - Otobe, Tomohito
AU - Higashiguchi, Takeshi
AU - Sakaue, Kazuyuki
AU - Washio, Masakazu
AU - Hatano, Tadashi
AU - Kon, Akira
AU - Kubota, Yuya
AU - Inubushi, Yuichi
AU - Owada, Shigeki
AU - Shibuya, Tatsunori
AU - Ziaja, Beata
AU - Nishikino, Masaharu
N1 - Funding Information:
The XFEL experiments were performed at BL1 in SACLA with the approval of the Japan Synchrotron Radiation Research Institute (JASRI) (Proposal No. 2016B8006, 2017A8026, 2017B8004, and 2018A8024). Calibration of X-ray CCD energy monitors and filters was performed at BL11D of The Photon Factory, KEK Japan (Proposal No. 2015G667 and 2017G638). One of the authors (T.-H.D.) acknowledges support from JSPS Postdoctoral Fellowship for Oversea Researchers (No. P16019), and JSPS KAKENHI Grant Number JP19K15402. Partial financial support from the Czech Ministry of Education (Grants LTT17015 and LM2015083) is acknowledged by N.M. A part of this study was supported by JSPS KAKENHI Grant Number JP16K05030, and MEXT Quantum Leap Flagship Program (MEXT Q-LEAP) Grant Number JPMXS0118067246, JPMXS0118070187. The authors thank L. Juha and R. Sobierajski for fruitful discussion. The authors are grateful to H. Hara, Y. Ono, T. Tamura, T. Gisuji, T. Ogura, N. Shinozaki, S. Yamauchi, Y. Shimada, K. Maeda, R. Kageyama, H. Kawasaki, M. Shoji, H. Mori (Utsunomiya University), Y. Koshiba, T. Takahashi, Y. Tadenuma, E. Terasawa, and S. Hanai (Waseda University) for his unparalleled technical support.
Publisher Copyright:
© 2019, The Author(s).
PY - 2019/12/1
Y1 - 2019/12/1
N2 - Interaction of a solid material with focused, intense pulses of high-energy photons or other particles (such as electrons and ions) creates a strong electronic excitation state within an ultra-short time and on ultra-small spatial scales. This offers the possibility to control the response of a material on a spatial scale less than a nanometer—crucial for the next generation of nano-devices. Here we create craters on the surface of a silicon substrate by focusing single femtosecond extreme ultraviolet pulse from the SACLA free-electron laser. We investigate the resulting surface modification in the vicinity of damage thresholds, establishing a connection to microscopic theoretical approaches, and, with their help, illustrating physical mechanisms for damage creation. The cooling during ablation by means of rapid electron and energy transport can suppress undesired hydrodynamical motions, allowing the silicon material to be directly processed with a precision reaching the observable limitation of an atomic force microscope.
AB - Interaction of a solid material with focused, intense pulses of high-energy photons or other particles (such as electrons and ions) creates a strong electronic excitation state within an ultra-short time and on ultra-small spatial scales. This offers the possibility to control the response of a material on a spatial scale less than a nanometer—crucial for the next generation of nano-devices. Here we create craters on the surface of a silicon substrate by focusing single femtosecond extreme ultraviolet pulse from the SACLA free-electron laser. We investigate the resulting surface modification in the vicinity of damage thresholds, establishing a connection to microscopic theoretical approaches, and, with their help, illustrating physical mechanisms for damage creation. The cooling during ablation by means of rapid electron and energy transport can suppress undesired hydrodynamical motions, allowing the silicon material to be directly processed with a precision reaching the observable limitation of an atomic force microscope.
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U2 - 10.1038/s42005-019-0253-2
DO - 10.1038/s42005-019-0253-2
M3 - Article
AN - SCOPUS:85075765460
SN - 2399-3650
VL - 2
JO - Communications Physics
JF - Communications Physics
IS - 1
M1 - 150
ER -