Defect analysis and prediction by applying the multistage software reliability growth model

Jieming Chi; Kiyoshi Honda; Hironori Washizaki; Yoshiaki Fukazawa; Kazuki Munakata; Sumie Morita; Tadahiro Uehara; Rieko Yamamoto

doi:10.1109/IWESEP.2017.16

Defect analysis and prediction by applying the multistage software reliability growth model

Jieming Chi, Kiyoshi Honda, Hironori Washizaki, Yoshiaki Fukazawa, Kazuki Munakata, Sumie Morita, Tadahiro Uehara, Rieko Yamamoto

Global Education Center

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

13 Citations (Scopus)

Abstract

In software development, defects are inevitable. To improve reliability, software reliability growth models are useful to analyze projects. Selecting an expedient model can also help with defect predictions, but the model must be well fitted to all the original data. A particular software reliability growth model may not fit all the data well. To overcome this issue, herein we use multistage modeling to fit defect data. In the multistage model, an evaluation is used to divide the data into several parts. Each part is fitted with its own growth model, and the separate models are recombined. As a case study, projects provided by a Japanese enterprise are analyzed by both traditional software reliability growth models and the multistage model. The multistage model has a better performance for data with a poor fit using a traditional software reliability growth model.

Original language	English
Title of host publication	Proceedings - 8th IEEE International Workshop on Empirical Software Engineering in Practice, IWESEP 2017
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	7-11
Number of pages	5
ISBN (Electronic)	9781509066995
DOIs	https://doi.org/10.1109/IWESEP.2017.16
Publication status	Published - 2017 May 10
Event	8th IEEE International Workshop on Empirical Software Engineering in Practice, IWESEP 2017 - Tokyo, Japan Duration: 2017 Mar 13 → …

Other

Other	8th IEEE International Workshop on Empirical Software Engineering in Practice, IWESEP 2017
Country/Territory	Japan
City	Tokyo
Period	17/3/13 → …

Keywords

Growth Model
Multistage Models
Software Reliability

ASJC Scopus subject areas

Software

Access to Document

10.1109/IWESEP.2017.16

Cite this

Chi, J., Honda, K., Washizaki, H., Fukazawa, Y., Munakata, K., Morita, S., Uehara, T., & Yamamoto, R. (2017). Defect analysis and prediction by applying the multistage software reliability growth model. In Proceedings - 8th IEEE International Workshop on Empirical Software Engineering in Practice, IWESEP 2017 (pp. 7-11). Article 7925417 Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IWESEP.2017.16

Defect analysis and prediction by applying the multistage software reliability growth model. / Chi, Jieming; Honda, Kiyoshi; Washizaki, Hironori et al.
Proceedings - 8th IEEE International Workshop on Empirical Software Engineering in Practice, IWESEP 2017. Institute of Electrical and Electronics Engineers Inc., 2017. p. 7-11 7925417.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Chi, J, Honda, K, Washizaki, H , Fukazawa, Y, Munakata, K, Morita, S, Uehara, T & Yamamoto, R 2017, Defect analysis and prediction by applying the multistage software reliability growth model. in Proceedings - 8th IEEE International Workshop on Empirical Software Engineering in Practice, IWESEP 2017., 7925417, Institute of Electrical and Electronics Engineers Inc., pp. 7-11, 8th IEEE International Workshop on Empirical Software Engineering in Practice, IWESEP 2017, Tokyo, Japan, 17/3/13. https://doi.org/10.1109/IWESEP.2017.16

Chi J, Honda K, Washizaki H , Fukazawa Y, Munakata K, Morita S et al. Defect analysis and prediction by applying the multistage software reliability growth model. In Proceedings - 8th IEEE International Workshop on Empirical Software Engineering in Practice, IWESEP 2017. Institute of Electrical and Electronics Engineers Inc. 2017. p. 7-11. 7925417 doi: 10.1109/IWESEP.2017.16

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Defect analysis and prediction by applying the multistage software reliability growth model

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Keywords

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