TY - JOUR
T1 - Degradation characteristics of YBCO-coated conductors subjected to overcurrent pulse
AU - Ishiyama, Atsushi
AU - Nishio, Yukiyasu
AU - Ueda, Hiroshi
AU - Kashima, Naoji
AU - Mori, Masami
AU - Watanabe, Tomonori
AU - Nagaya, Shigeo
AU - Yagi, Masashi
AU - Mukoyama, Shinichi
AU - Machi, Takato
AU - Shiohara, Yuh
N1 - Funding Information:
Manuscript received August 20, 2008. First published June 05, 2009; current version published July 15, 2009. This work was supported by the New Energy and Industrial Technology Development Organization (NEDO). A. Ishiyama, Y. Nishio, H. Ueda, and H. Kono are with the Department of Electrical Engineering and Bioscience, Waseda University, Tokyo 169-8555, Japan (e-mail: atsushi@waseda.jp). N. Kashima, M. Mori, T. Watanabe, and S. Nagaya are with the Chubu Electric Power Co., Inc., Nagoya 459-8522, Japan. M. Yagi and S. Mukoyama are with Furukawa Electric Co., Ltd, Tokyo 100-8322, Japan (e-mail: mukoyama@ch.furukawa.co.jp). T. Machi and Y. Shiohara are with the International Superconductivity Technology Center, Superconductivity Research Laboratory, Tokyo 135-0062, Japan (e-mail: shiohara@istec.or.jp). Digital Object Identifier 10.1109/TASC.2009.2018734
PY - 2009/6
Y1 - 2009/6
N2 - YBCO tapes are expected to be used in future high temperature superconducting (HTS) applications because of their good Jc characteristics at high temperatures and in high applied magnetic fields. In applications to electric power devices such as transmission cables, transformers, and fault current limiters, the HTS conductors will be subjected to short-circuit fault currents that are 10 to 30 times the normal operating current. These overcurrents are greater than the critical current, and degrade or burn-out the HTS conductors. Therefore, it is important to clarify the mechanism of the degradation caused by such overcurrent pulses. We carried out preliminary experiments on damage caused by overcurrent pulse drive, focusing on the temperature limitation without suffering degradation for overcurrent pulse operation. A 10-mm-wide YBCO tape was cut into 2-mm-wide sample tapes by a laser beam, and the sample tapes were soldered on silver-deposited 100-μm-thick copper plates. Overcurrent tests were carried out on these sample tapes and Ic degradation was investigated. In addition the contact interface between YBCO and the Ag layer or buffer layer before and after the overcurrent drives has been investigated in order to clarify the correlation between the degradation and delamination of sample tapes.
AB - YBCO tapes are expected to be used in future high temperature superconducting (HTS) applications because of their good Jc characteristics at high temperatures and in high applied magnetic fields. In applications to electric power devices such as transmission cables, transformers, and fault current limiters, the HTS conductors will be subjected to short-circuit fault currents that are 10 to 30 times the normal operating current. These overcurrents are greater than the critical current, and degrade or burn-out the HTS conductors. Therefore, it is important to clarify the mechanism of the degradation caused by such overcurrent pulses. We carried out preliminary experiments on damage caused by overcurrent pulse drive, focusing on the temperature limitation without suffering degradation for overcurrent pulse operation. A 10-mm-wide YBCO tape was cut into 2-mm-wide sample tapes by a laser beam, and the sample tapes were soldered on silver-deposited 100-μm-thick copper plates. Overcurrent tests were carried out on these sample tapes and Ic degradation was investigated. In addition the contact interface between YBCO and the Ag layer or buffer layer before and after the overcurrent drives has been investigated in order to clarify the correlation between the degradation and delamination of sample tapes.
KW - Degradation
KW - Overcurrent pulse
KW - Temperature limitation
KW - YBCO tape
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U2 - 10.1109/TASC.2009.2018734
DO - 10.1109/TASC.2009.2018734
M3 - Article
AN - SCOPUS:68749112503
SN - 1051-8223
VL - 19
SP - 3483
EP - 3486
JO - IEEE Transactions on Applied Superconductivity
JF - IEEE Transactions on Applied Superconductivity
IS - 3
M1 - 5067186
ER -