Degradation defection methods for electronic circuits

Hiroshi Inujima*

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution


A degradation diagnosis method that detects the degradation symptoms of electronic cards earlier and with higher sensitivity than previous techniques is presented. One type of degraded IC is obtained experimentally by applying a low surge voltage. For the case of the op-amps, there exists a quantitative relation between the degradation of the IC predicted from the increasing off-set current and the correlation with output noise. The root-mean-square value of the noise is an effective index of degradation detection. A method based on a measurement of the minimum value of supply voltage necessary to maintain the correct logical operation is effective in detecting degraded TTLs. An automatic instrument for degradation detection of electronic cards is developed, and its effectiveness is verified.

Original languageEnglish
Title of host publicationSignal Processing and System Control Factory Automation
PublisherPubl by IEEE
Number of pages6
ISBN (Print)0879426004
Publication statusPublished - 1990 Dec 1
Externally publishedYes
Event16th Annual Conference of IEEE Industrial Electronics Society - IECON'90 - Pacific Grove, CA, USA
Duration: 1990 Nov 271990 Nov 30

Publication series

NameIECON Proceedings (Industrial Electronics Conference)


Other16th Annual Conference of IEEE Industrial Electronics Society - IECON'90
CityPacific Grove, CA, USA

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Electrical and Electronic Engineering


Dive into the research topics of 'Degradation defection methods for electronic circuits'. Together they form a unique fingerprint.

Cite this