Degradation of CH3NH3PbI3 perovskite due to soft x-ray irradiation as analyzed by an x-ray photoelectron spectroscopy time-dependent measurement method

Keisuke Motoki; Yu Miyazawa; Daisuke Kobayashi; Masashi Ikegami; Tsutomu Miyasaka; Tomoyuki Yamamoto; Kazuyuki Hirose

doi:10.1063/1.4977238

Degradation of CH₃NH₃PbI₃ perovskite due to soft x-ray irradiation as analyzed by an x-ray photoelectron spectroscopy time-dependent measurement method

Keisuke Motoki, Yu Miyazawa, Daisuke Kobayashi, Masashi Ikegami, Tsutomu Miyasaka, Tomoyuki Yamamoto, Kazuyuki Hirose

School of Fundamental Science and Engineering

Research output: Contribution to journal › Article › peer-review

29 Citations (Scopus)

Abstract

The effects of soft X-ray exposure on structures of CH₃NH₃PbI₃ perovskite were investigated using an X-ray photoelectron spectroscopy (XPS) time-dependent measurement method. A crystalline sample was fabricated with the inverse-temperature crystallization method. The time evolutions of the core-level and valence-band spectra were recorded to determine the compositional ratios and valence band electronic structure of the sample, respectively. In addition, first-principles calculations were conducted to evaluate the valence band XPS spectra. The in situ XPS analysis combined with theoretical calculations demonstrated a degradation of the surface of CH₃NH₃PbI₃ perovskite into PbI₂ owing to the evaporation of methylammonium iodide.

Original language	English
Article number	085501
Journal	Journal of Applied Physics
Volume	121
Issue number	8
DOIs	https://doi.org/10.1063/1.4977238
Publication status	Published - 2017 Feb 28

ASJC Scopus subject areas

Physics and Astronomy(all)

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10.1063/1.4977238

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@article{6924783bdd9a4bd0bb56be975afab188,

title = "Degradation of CH3NH3PbI3 perovskite due to soft x-ray irradiation as analyzed by an x-ray photoelectron spectroscopy time-dependent measurement method",

abstract = "The effects of soft X-ray exposure on structures of CH3NH3PbI3 perovskite were investigated using an X-ray photoelectron spectroscopy (XPS) time-dependent measurement method. A crystalline sample was fabricated with the inverse-temperature crystallization method. The time evolutions of the core-level and valence-band spectra were recorded to determine the compositional ratios and valence band electronic structure of the sample, respectively. In addition, first-principles calculations were conducted to evaluate the valence band XPS spectra. The in situ XPS analysis combined with theoretical calculations demonstrated a degradation of the surface of CH3NH3PbI3 perovskite into PbI2 owing to the evaporation of methylammonium iodide.",

author = "Keisuke Motoki and Yu Miyazawa and Daisuke Kobayashi and Masashi Ikegami and Tsutomu Miyasaka and Tomoyuki Yamamoto and Kazuyuki Hirose",

note = "Publisher Copyright: {\textcopyright} 2017 Author(s).",

year = "2017",

month = feb,

day = "28",

doi = "10.1063/1.4977238",

language = "English",

volume = "121",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics Publising LLC",

number = "8",

}

TY - JOUR

T1 - Degradation of CH3NH3PbI3 perovskite due to soft x-ray irradiation as analyzed by an x-ray photoelectron spectroscopy time-dependent measurement method

AU - Motoki, Keisuke

AU - Miyazawa, Yu

AU - Kobayashi, Daisuke

AU - Ikegami, Masashi

AU - Miyasaka, Tsutomu

AU - Yamamoto, Tomoyuki

AU - Hirose, Kazuyuki

PY - 2017/2/28

Y1 - 2017/2/28

N2 - The effects of soft X-ray exposure on structures of CH3NH3PbI3 perovskite were investigated using an X-ray photoelectron spectroscopy (XPS) time-dependent measurement method. A crystalline sample was fabricated with the inverse-temperature crystallization method. The time evolutions of the core-level and valence-band spectra were recorded to determine the compositional ratios and valence band electronic structure of the sample, respectively. In addition, first-principles calculations were conducted to evaluate the valence band XPS spectra. The in situ XPS analysis combined with theoretical calculations demonstrated a degradation of the surface of CH3NH3PbI3 perovskite into PbI2 owing to the evaporation of methylammonium iodide.

AB - The effects of soft X-ray exposure on structures of CH3NH3PbI3 perovskite were investigated using an X-ray photoelectron spectroscopy (XPS) time-dependent measurement method. A crystalline sample was fabricated with the inverse-temperature crystallization method. The time evolutions of the core-level and valence-band spectra were recorded to determine the compositional ratios and valence band electronic structure of the sample, respectively. In addition, first-principles calculations were conducted to evaluate the valence band XPS spectra. The in situ XPS analysis combined with theoretical calculations demonstrated a degradation of the surface of CH3NH3PbI3 perovskite into PbI2 owing to the evaporation of methylammonium iodide.

UR - http://www.scopus.com/inward/record.url?scp=85014025703&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85014025703&partnerID=8YFLogxK

U2 - 10.1063/1.4977238

DO - 10.1063/1.4977238

M3 - Article

AN - SCOPUS:85014025703

SN - 0021-8979

VL - 121

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 8

M1 - 085501

ER -

Degradation of CH₃NH₃PbI₃ perovskite due to soft x-ray irradiation as analyzed by an x-ray photoelectron spectroscopy time-dependent measurement method

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