Abstract
A 128-Mb SOI DRAM has been developed featuring the floating body cell (FBC). To keep the cell data state from being degraded by the word-line (WL) disturb due to the charge pumping and to reduce the refresh busy rate, a sense amplifier (S/A) is arranged for every bit-line (BL) and replenishes data "1" cells' bodies with holes which are lost by the disturb in every read and write cycle. The power is reduced by operating the S/As asymmetrically between the selected and the unselected thanks to that the number of holes to be replenished in the unselected S/As for charge pumping is two order of magnitude smaller than that required for writing the data "1". The multi-pair averaging of dummy cells generates a very accurate reference current for distinguishing the data "1" and "0" and a Monte Carlo simulation shows that it achieves a sensing scheme robust enough to realize all good parts of the DRAM with a reasonable amount of redundancy. The cell's feature of quasi-nondestructive read-out is also advantageous for making an SRAM interface of the DRAM or hiding refresh from uses without sacrificing the access time.
Original language | English |
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Pages (from-to) | 135-145 |
Number of pages | 11 |
Journal | IEEE Journal of Solid-State Circuits |
Volume | 41 |
Issue number | 1 |
DOIs | |
Publication status | Published - 2006 Jan |
Externally published | Yes |
Keywords
- 128 Mbit
- Charge pumping
- DRAM robustness
- Dummy cells
- Floating body cell
- Monte Carlo simulation
- Multi-pair averaging
- Quasi-nondestructive read-out
- Redundancy
- SOI DRAM
- Sense amplifier
- Silicon-on-insulator technology
- Word-line disturb
ASJC Scopus subject areas
- Electrical and Electronic Engineering