TY - GEN
T1 - Detection of careless mistakes during programming learning using a simple electroencephalograph
AU - Umezawa, Katsuyuki
AU - Nakazawa, Makoto
AU - Kobayashi, Manabu
AU - Ishii, Yutaka
AU - Nakano, Michiko
AU - Hirasawa, Shigeichi
N1 - Funding Information:
Part of this research was conducted as part of the research project “Research on e-learning for next-generation” of the Waseda Research Institute for Science and Engineering, Waseda University. Part of this work was supported by JSPS KAKENHI Grant Numbers JP20K03082, JP19H01721, JP19K04914, and JP17K01101, and Special Account 1010000175806 of the NTT Comprehensive Agreement on Collaborative Research with the Waseda University Research Institute for Science and Engineering. Research leading to this paper was partially supported by the grant as a research working group “ICT and Education” of JASMIN.
Publisher Copyright:
© 2020 IEEE.
PY - 2020/8
Y1 - 2020/8
N2 - There are several difficulties encountered by learners during learning such as good or bad learning content, the difficulty level of learning content, and the degree of learning proficiency. It is possible to detect these difficulties by measuring the browsing history, editing history, and biological information such as brain waves or eye-tracking information. In this paper, we measure electroencephalograph (EEG) information during programming learning. We focus on the relationship between task response time and EEG, and try to detect careless mistakes due to the lack of attention. The results show that careless mistakes during programming learning can be detected by experiments.
AB - There are several difficulties encountered by learners during learning such as good or bad learning content, the difficulty level of learning content, and the degree of learning proficiency. It is possible to detect these difficulties by measuring the browsing history, editing history, and biological information such as brain waves or eye-tracking information. In this paper, we measure electroencephalograph (EEG) information during programming learning. We focus on the relationship between task response time and EEG, and try to detect careless mistakes due to the lack of attention. The results show that careless mistakes during programming learning can be detected by experiments.
KW - Careless Mistake
KW - E-Learning
KW - Self-study System
KW - Simple EEG
UR - http://www.scopus.com/inward/record.url?scp=85093086730&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85093086730&partnerID=8YFLogxK
U2 - 10.1109/ICCSE49874.2020.9201772
DO - 10.1109/ICCSE49874.2020.9201772
M3 - Conference contribution
AN - SCOPUS:85093086730
T3 - 15th International Conference on Computer Science and Education, ICCSE 2020
SP - 72
EP - 77
BT - 15th International Conference on Computer Science and Education, ICCSE 2020
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 15th International Conference on Computer Science and Education, ICCSE 2020
Y2 - 18 August 2020 through 20 August 2020
ER -